Nonlinear Compression Codes Used In IC Testing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F19%3A00006730" target="_blank" >RIV/46747885:24220/19:00006730 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8724661&isnumber=8724630" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8724661&isnumber=8724630</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/DDECS.2019.8724661" target="_blank" >10.1109/DDECS.2019.8724661</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Nonlinear Compression Codes Used In IC Testing

Popis výsledku v původním jazyce

It was found that the linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. These extended nonlinear binary codes can be used for pattern compression and decompression. The number of scan chains loaded in parallel from the sequential decompressor may be increased while the number of specified bits is kept. The nonlinear structures guarantee the number of independently specified bits within the whole decompressed test pattern independently on the scan chain clock cycle for a substantially higher number of parallel scan chains than the linear decompressors while the number of bits transferred from the tester is kept. We proposed an algorithm that finds the appropriate nonlinear modification circuit of the sequential decompressor and verifies the test pattern quality for different numbers of care bits in a test pattern.

Název v anglickém jazyce

Nonlinear Compression Codes Used In IC Testing

Popis výsledku anglicky

It was found that the linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. These extended nonlinear binary codes can be used for pattern compression and decompression. The number of scan chains loaded in parallel from the sequential decompressor may be increased while the number of specified bits is kept. The nonlinear structures guarantee the number of independently specified bits within the whole decompressed test pattern independently on the scan chain clock cycle for a substantially higher number of parallel scan chains than the linear decompressors while the number of bits transferred from the tester is kept. We proposed an algorithm that finds the appropriate nonlinear modification circuit of the sequential decompressor and verifies the test pattern quality for different numbers of care bits in a test pattern.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019

ISBN

978-1-72810-073-9

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

—

Název nakladatele

IEEE

Místo vydání

NEW YORK, USA

Místo konání akce

Cluj-Napoca

Datum konání akce

1. 1. 2019

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000492839800025