A secret luminescence killer in deepest QWs of InGaN/GaN multiple quantum well structures
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F20%3A00010354" target="_blank" >RIV/46747885:24220/20:00010354 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68378271:_____/20:00532847 RIV/68407700:21340/20:00345113 RIV/00216208:11320/20:10423669
Výsledek na webu
<a href="https://www.sciencedirect.com/science/article/pii/S0022024820301020?via=ihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0022024820301020?via=ihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jcrysgro.2020.125579" target="_blank" >10.1016/j.jcrysgro.2020.125579</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
A secret luminescence killer in deepest QWs of InGaN/GaN multiple quantum well structures
Popis výsledku v původním jazyce
This work suggests new alternative explanation why a single InGaN quantum well (QW) or the deepest QWs in the multiple quantum well (MQW) structures suffer with a high non-radiative recombination rate. According to SIMS results, positron annihilation spectroscopy and photoluminescence measurements we suggest that vacancy of Ga in complex with hydrogen atoms can play a dominant role in non-radiative Shockley-Read-Hall recombination of the deepest QWs in InGaN/GaN MQW structures. Vacancy of gallium originate dominantly in GaN buffer layers grown at higher temperatures in H-2 atmosphere and are transported to the InGaN/GaN MQW region by diffusion, where they are very effectively trapped in InGaN layers and form complex defects with hydrogen atoms during epitaxy of InGaN layers. Trapping of gallium vacancies is another suggested mechanism explaining why the widely used In containing prelayers help to increase the luminescence efficiency of the InGaN/GaN MQW active region grown above them. Understanding the mechanism why the luminescence efficiency is suppressed in deeper QWs may be very important for LED community and can help to develop new improved technologies for the growth of InGaN/GaN MQW active region.
Název v anglickém jazyce
A secret luminescence killer in deepest QWs of InGaN/GaN multiple quantum well structures
Popis výsledku anglicky
This work suggests new alternative explanation why a single InGaN quantum well (QW) or the deepest QWs in the multiple quantum well (MQW) structures suffer with a high non-radiative recombination rate. According to SIMS results, positron annihilation spectroscopy and photoluminescence measurements we suggest that vacancy of Ga in complex with hydrogen atoms can play a dominant role in non-radiative Shockley-Read-Hall recombination of the deepest QWs in InGaN/GaN MQW structures. Vacancy of gallium originate dominantly in GaN buffer layers grown at higher temperatures in H-2 atmosphere and are transported to the InGaN/GaN MQW region by diffusion, where they are very effectively trapped in InGaN layers and form complex defects with hydrogen atoms during epitaxy of InGaN layers. Trapping of gallium vacancies is another suggested mechanism explaining why the widely used In containing prelayers help to increase the luminescence efficiency of the InGaN/GaN MQW active region grown above them. Understanding the mechanism why the luminescence efficiency is suppressed in deeper QWs may be very important for LED community and can help to develop new improved technologies for the growth of InGaN/GaN MQW active region.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20500 - Materials engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Crystal Growth
ISSN
0022-0248
e-ISSN
—
Svazek periodika
536
Číslo periodika v rámci svazku
APR
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
6
Strana od-do
—
Kód UT WoS článku
000520838100001
EID výsledku v databázi Scopus
2-s2.0-85080922153