Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

Popis výsledku v původním jazyce

The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. We have extensively studied the quality of generated patterns and we have found several interesting properties of them. Thefirst possibility how to use the CA is to generate pseudoexhaustive test sets as the CA can generate code words of codes with higher minimal code distance of the dual code. There is no need of reseeding the CA in order to generate all the code wordsThe proposed CA can also generate weighted random patterns with different global weights which can be used instead of linear feedback shift register (LFSR) pseudorandom sequences, the fault coverage is higher. It can also be used as deterministic pattern compactor in mixed mode testing. Several experiments were done with ISCAS 85 and 89 benchmark circuits. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR .

Název v anglickém jazyce

Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

Popis výsledku anglicky

The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. We have extensively studied the quality of generated patterns and we have found several interesting properties of them. Thefirst possibility how to use the CA is to generate pseudoexhaustive test sets as the CA can generate code words of codes with higher minimal code distance of the dual code. There is no need of reseeding the CA in order to generate all the code wordsThe proposed CA can also generate weighted random patterns with different global weights which can be used instead of linear feedback shift register (LFSR) pseudorandom sequences, the fault coverage is higher. It can also be used as deterministic pattern compactor in mixed mode testing. Several experiments were done with ISCAS 85 and 89 benchmark circuits. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR .

Druh

C - Kapitola v odborné knize

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

1999

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Lecture Notes in Computer Science

ISBN

3-540-66483-1

Počet stran výsledku

18

Strana od-do

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Počet stran knihy

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Název nakladatele

Springer

Místo vydání

Berlin, Heidelberg, New York

Kód UT WoS kapitoly

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