Yield and Defect Level Prediction of Designed Printed Circuit Board

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F11%3A43914916" target="_blank" >RIV/49777513:23220/11:43914916 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1109/ISSE.2011.6053570" target="_blank" >http://dx.doi.org/10.1109/ISSE.2011.6053570</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/ISSE.2011.6053570" target="_blank" >10.1109/ISSE.2011.6053570</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Yield and Defect Level Prediction of Designed Printed Circuit Board

Popis výsledku v původním jazyce

In this paper a new prediction tool is presented, which can provide both yield and defect level predictions. The tool, which is based on DPMO (defects per million opportunities) metric, is intended for newly designed printed circuit board assemblies. Itis programmed in Visual Basic for Application (VBA) and it can be operated in MS Excel environment. Yield prediction is based on so called the yield-DPMO model that is an extension of the yield prediction model, which was created in my dissertation and published in the paper [1]. The yield-DPMO model provides more outputs for quality planners then yield prediction model. The defect level prediction is based on the so called the "defect level-DPMO" model, which works on the basis of complexity based estimate, where from inputs data are determined the defect spectrums and tests coverage. The advantage of DPMO is the fact that it is fully comparable metric and it is not associated only with the certain manufacturing line. Thanks to this to

Název v anglickém jazyce

Yield and Defect Level Prediction of Designed Printed Circuit Board

Popis výsledku anglicky

In this paper a new prediction tool is presented, which can provide both yield and defect level predictions. The tool, which is based on DPMO (defects per million opportunities) metric, is intended for newly designed printed circuit board assemblies. Itis programmed in Visual Basic for Application (VBA) and it can be operated in MS Excel environment. Yield prediction is based on so called the yield-DPMO model that is an extension of the yield prediction model, which was created in my dissertation and published in the paper [1]. The yield-DPMO model provides more outputs for quality planners then yield prediction model. The defect level prediction is based on the so called the "defect level-DPMO" model, which works on the basis of complexity based estimate, where from inputs data are determined the defect spectrums and tests coverage. The advantage of DPMO is the fact that it is fully comparable metric and it is not associated only with the certain manufacturing line. Thanks to this to

Druh

D - Stať ve sborníku

CEP obor

JS - Řízení spolehlivosti a kvality, zkušebnictví

OECD FORD obor

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Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

34th International Spring Seminar on Electronics Technology

ISBN

978-1-4577-2112-0

ISSN

2161-2528

e-ISSN

—

Počet stran výsledku

6

Strana od-do

162-167

Název nakladatele

IEEE

Místo vydání

Piscataway

Místo konání akce

Tatranská Lomnica

Datum konání akce

11. 5. 2011

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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