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Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F25%3A43976263" target="_blank" >RIV/49777513:23220/25:43976263 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://ieeexplore.ieee.org/document/11222486" target="_blank" >https://ieeexplore.ieee.org/document/11222486</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.23919/EMPC63132.2025.11222486" target="_blank" >10.23919/EMPC63132.2025.11222486</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink

  • Popis výsledku v původním jazyce

    Efficient heat dissipation is critical to the reliability and performance of modern high power density electronic systems. Direct soldering of power components to heat sinks minimizes thermal resistance, but traditional reflow soldering methods often result in the formation of voids in the joints, degrading thermal conductivity. This paper focuses on optimizing the temperature profile and vacuum process when soldering electronic components to heat sinks to minimize the occurrence of these voids. Key parameters such as temperature rise rate, time above liquidus (TAL), peak temperature, and most importantly timing and level of vacuum application are described. Using an experiment with different settings of the TAL parameters and vacuum timing, analysis was performed by X-ray inspection and quantification of the percentage of voids. The results show that the correct timing of vacuum application is a critical factor - the most effective vacuum application is after the solder has completely melted. Premature vacuuming leads to an increase in the number of voids, despite the extended TAL time. By optimizing the temperature profile and timing the vacuum correctly, a significant reduction in the occurrence of voids in the joint has been achieved. The paper presents an experimental approach and provides a instructions for achieving a high quality solder joint with minimal thermal resistance.

  • Název v anglickém jazyce

    Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink

  • Popis výsledku anglicky

    Efficient heat dissipation is critical to the reliability and performance of modern high power density electronic systems. Direct soldering of power components to heat sinks minimizes thermal resistance, but traditional reflow soldering methods often result in the formation of voids in the joints, degrading thermal conductivity. This paper focuses on optimizing the temperature profile and vacuum process when soldering electronic components to heat sinks to minimize the occurrence of these voids. Key parameters such as temperature rise rate, time above liquidus (TAL), peak temperature, and most importantly timing and level of vacuum application are described. Using an experiment with different settings of the TAL parameters and vacuum timing, analysis was performed by X-ray inspection and quantification of the percentage of voids. The results show that the correct timing of vacuum application is a critical factor - the most effective vacuum application is after the solder has completely melted. Premature vacuuming leads to an increase in the number of voids, despite the extended TAL time. By optimizing the temperature profile and timing the vacuum correctly, a significant reduction in the occurrence of voids in the joint has been achieved. The paper presents an experimental approach and provides a instructions for achieving a high quality solder joint with minimal thermal resistance.

Klasifikace

  • Druh

    D - Stať ve sborníku

  • CEP obor

  • OECD FORD obor

    20201 - Electrical and electronic engineering

Návaznosti výsledku

  • Projekt

  • Návaznosti

    S - Specificky vyzkum na vysokych skolach

Ostatní

  • Rok uplatnění

    2025

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název statě ve sborníku

    2025 25th European Microelectronics and Packaging Conference &amp; Exhibition (EMPC)

  • ISBN

    978-1-73950-051-1

  • ISSN

  • e-ISSN

  • Počet stran výsledku

    5

  • Strana od-do

    1-5

  • Název nakladatele

    IEEE

  • Místo vydání

    Piscataway

  • Místo konání akce

    Grenoble, France

  • Datum konání akce

    16. 9. 2025

  • Typ akce podle státní příslušnosti

    EUR - Evropská akce

  • Kód UT WoS článku