Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F25%3A43976263" target="_blank" >RIV/49777513:23220/25:43976263 - isvavai.cz</a>
Výsledek na webu
<a href="https://ieeexplore.ieee.org/document/11222486" target="_blank" >https://ieeexplore.ieee.org/document/11222486</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.23919/EMPC63132.2025.11222486" target="_blank" >10.23919/EMPC63132.2025.11222486</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink
Popis výsledku v původním jazyce
Efficient heat dissipation is critical to the reliability and performance of modern high power density electronic systems. Direct soldering of power components to heat sinks minimizes thermal resistance, but traditional reflow soldering methods often result in the formation of voids in the joints, degrading thermal conductivity. This paper focuses on optimizing the temperature profile and vacuum process when soldering electronic components to heat sinks to minimize the occurrence of these voids. Key parameters such as temperature rise rate, time above liquidus (TAL), peak temperature, and most importantly timing and level of vacuum application are described. Using an experiment with different settings of the TAL parameters and vacuum timing, analysis was performed by X-ray inspection and quantification of the percentage of voids. The results show that the correct timing of vacuum application is a critical factor - the most effective vacuum application is after the solder has completely melted. Premature vacuuming leads to an increase in the number of voids, despite the extended TAL time. By optimizing the temperature profile and timing the vacuum correctly, a significant reduction in the occurrence of voids in the joint has been achieved. The paper presents an experimental approach and provides a instructions for achieving a high quality solder joint with minimal thermal resistance.
Název v anglickém jazyce
Temperature Profile Optimization for Vacuum Soldering of Components on Heat Sink
Popis výsledku anglicky
Efficient heat dissipation is critical to the reliability and performance of modern high power density electronic systems. Direct soldering of power components to heat sinks minimizes thermal resistance, but traditional reflow soldering methods often result in the formation of voids in the joints, degrading thermal conductivity. This paper focuses on optimizing the temperature profile and vacuum process when soldering electronic components to heat sinks to minimize the occurrence of these voids. Key parameters such as temperature rise rate, time above liquidus (TAL), peak temperature, and most importantly timing and level of vacuum application are described. Using an experiment with different settings of the TAL parameters and vacuum timing, analysis was performed by X-ray inspection and quantification of the percentage of voids. The results show that the correct timing of vacuum application is a critical factor - the most effective vacuum application is after the solder has completely melted. Premature vacuuming leads to an increase in the number of voids, despite the extended TAL time. By optimizing the temperature profile and timing the vacuum correctly, a significant reduction in the occurrence of voids in the joint has been achieved. The paper presents an experimental approach and provides a instructions for achieving a high quality solder joint with minimal thermal resistance.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20201 - Electrical and electronic engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC)
ISBN
978-1-73950-051-1
ISSN
—
e-ISSN
—
Počet stran výsledku
5
Strana od-do
1-5
Název nakladatele
IEEE
Místo vydání
Piscataway
Místo konání akce
Grenoble, France
Datum konání akce
16. 9. 2025
Typ akce podle státní příslušnosti
EUR - Evropská akce
Kód UT WoS článku
—