Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F13%3A43918229" target="_blank" >RIV/49777513:23640/13:43918229 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.tca.2013.01.010" target="_blank" >http://dx.doi.org/10.1016/j.tca.2013.01.010</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tca.2013.01.010" target="_blank" >10.1016/j.tca.2013.01.010</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films

Popis výsledku v původním jazyce

Two techniques of photothermal radiometry (PTR) in front face configuration were used to determine the thermal conductivity of thin nanocrystalline films. The first technique relies on using modulated laser beam as a heating source. The second is based on pulsed laser heating where the pulse can be assimilated to a Dirac function. In the two measurement setups, the infrared radiation emitted from the heated surface of the sample is measured by an infrared detector. The thermal conductivity of CrN thin films prepared with various thicknesses by magnetron sputtering on silicon substrates was investigated by both techniques showing a dependence on the film microstructure. The thermal resistance at the film-substrate interface and intrinsic thermal conductivity of the films were identified by the two techniques and the results are in a very good agreement.

Název v anglickém jazyce

Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films

Popis výsledku anglicky

Two techniques of photothermal radiometry (PTR) in front face configuration were used to determine the thermal conductivity of thin nanocrystalline films. The first technique relies on using modulated laser beam as a heating source. The second is based on pulsed laser heating where the pulse can be assimilated to a Dirac function. In the two measurement setups, the infrared radiation emitted from the heated surface of the sample is measured by an infrared detector. The thermal conductivity of CrN thin films prepared with various thicknesses by magnetron sputtering on silicon substrates was investigated by both techniques showing a dependence on the film microstructure. The thermal resistance at the film-substrate interface and intrinsic thermal conductivity of the films were identified by the two techniques and the results are in a very good agreement.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BJ - Termodynamika

OECD FORD obor

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Projekt

<a href="/cs/project/ED2.1.00%2F03.0088" target="_blank" >ED2.1.00/03.0088: Centrum nových technologií a materiálů (CENTEM)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

THERMOCHIMICA ACTA

ISSN

0040-6031

e-ISSN

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Svazek periodika

556

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

1-5

Kód UT WoS článku

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EID výsledku v databázi Scopus

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