Investigation of RF and DC plasma - jet system during deposition of highly oriented ZnO Films
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12410%2F03%3A00004555" target="_blank" >RIV/60076658:12410/03:00004555 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Investigation of RF and DC plasma - jet system during deposition of highly oriented ZnO Films
Popis výsledku v původním jazyce
RF and DC plasma jet sputtering systems were investigated as a source for deposition of ZnO thin films. Deposited ZnO films have a strong orientation of hexagonal crystallities with 'c' axis perpendicular to the substrate surface. Temperature of the substrate did not exceed 150oC during the deposition. Langmuir probe measurement performed at the substrate revealed two group of electrons with approximate maxwellian distribution in the DC plasma jet and one maxwellian group in the case of RF plasma jet system. Electron concentration in the RF jet was about 5 109 - 1010 cm-3 with electron temperature 2.5 -3.5 eV. Concentration of cold electrons in the DC jet was usually 109 cm-3 with temperature 0.5 eV and hot electrons 108 cm-3 with temperature 2-3.5 eV.Photography also confirmed that plasma density is higher in the position of the substrate in the RF jet than in the DC jet. Other obtained macroscopic parameters as plasma potential, floating potential and DC voltage of the Zn nozzle rel
Název v anglickém jazyce
Investigation of RF and DC plasma - jet system during deposition of highly oriented ZnO Films
Popis výsledku anglicky
RF and DC plasma jet sputtering systems were investigated as a source for deposition of ZnO thin films. Deposited ZnO films have a strong orientation of hexagonal crystallities with 'c' axis perpendicular to the substrate surface. Temperature of the substrate did not exceed 150oC during the deposition. Langmuir probe measurement performed at the substrate revealed two group of electrons with approximate maxwellian distribution in the DC plasma jet and one maxwellian group in the case of RF plasma jet system. Electron concentration in the RF jet was about 5 109 - 1010 cm-3 with electron temperature 2.5 -3.5 eV. Concentration of cold electrons in the DC jet was usually 109 cm-3 with temperature 0.5 eV and hot electrons 108 cm-3 with temperature 2-3.5 eV.Photography also confirmed that plasma density is higher in the position of the substrate in the RF jet than in the DC jet. Other obtained macroscopic parameters as plasma potential, floating potential and DC voltage of the Zn nozzle rel
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
BL - Fyzika plasmatu a výboje v plynech
OECD FORD obor
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Návaznosti výsledku
Projekt
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Návaznosti
Z - Vyzkumny zamer (s odkazem do CEZ)
Ostatní
Rok uplatnění
2003
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
In: Surface and Coatings Technology
ISSN
0257-8972
e-ISSN
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Svazek periodika
2003
Číslo periodika v rámci svazku
174-175
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
5
Strana od-do
627-631
Kód UT WoS článku
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EID výsledku v databázi Scopus
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