Characterization of silicate glasses implanted with Ag+ ions

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F11%3A43891732" target="_blank" >RIV/60461373:22310/11:43891732 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >http://dx.doi.org/10.1063/1.3665331</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >10.1063/1.3665331</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of silicate glasses implanted with Ag+ ions

Popis výsledku v původním jazyce

Silica?based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica?based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm?2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X?ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM?2008. The optical properties of the prepared nanostructures were examined by UV?VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post?implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.

Název v anglickém jazyce

Characterization of silicate glasses implanted with Ag+ ions

Popis výsledku anglicky

Silica?based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica?based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm?2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X?ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM?2008. The optical properties of the prepared nanostructures were examined by UV?VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post?implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CA - Anorganická chemie

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

AIP Conference Proceedings

ISSN

0094-243X

e-ISSN

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Svazek periodika

1412

Číslo periodika v rámci svazku

2011

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

327-334

Kód UT WoS článku

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EID výsledku v databázi Scopus

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