The Characterisation of Silicate Glasses Implanted with Ag+ Ions

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F11%3A00370848" target="_blank" >RIV/61389005:_____/11:00370848 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >http://dx.doi.org/10.1063/1.3665331</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >10.1063/1.3665331</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The Characterisation of Silicate Glasses Implanted with Ag+ Ions

Popis výsledku v původním jazyce

Silica-based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica-based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm-2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X-ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM-2008. The optical properties of the prepared nanostructures were examined by UV-VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post-implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.

Název v anglickém jazyce

The Characterisation of Silicate Glasses Implanted with Ag+ Ions

Popis výsledku anglicky

Silica-based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica-based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm-2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X-ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM-2008. The optical properties of the prepared nanostructures were examined by UV-VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post-implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.

Druh

D - Stať ve sborníku

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

—

Projekt

<a href="/cs/project/GA106%2F09%2F0125" target="_blank" >GA106/09/0125: Příprava a vlastnosti struktur kov/polymer</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

AIP Conference Proceedings

ISBN

978-0-7354-0986-6

ISSN

—

e-ISSN

—

Počet stran výsledku

7

Strana od-do

327-334

Název nakladatele

American Institute of Physics

Místo vydání

Melville

Místo konání akce

Crete

Datum konání akce

12. 6. 2011

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000301973400042