Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F12%3A43894285" target="_blank" >RIV/60461373:22310/12:43894285 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389005:_____/12:00370863 RIV/61389013:_____/12:00370863 RIV/44555601:13440/12:43883914

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.nimb.2011.01.109" target="_blank" >http://dx.doi.org/10.1016/j.nimb.2011.01.109</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nimb.2011.01.109" target="_blank" >10.1016/j.nimb.2011.01.109</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences

Popis výsledku v původním jazyce

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at RT to the fluences (0.25-1.5) x 10(17) cm(-2) at ion current density of 4 mu A cm(-2). Then some of the samples were annealed at the temperatures close to the polymer glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree reasonably with those simulated using TRYDIN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. The changes in the polymer sheet resistance of the implanted and annealed samples were measured by standard two-point technique. The sheet

Název v anglickém jazyce

Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences

Popis výsledku anglicky

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at RT to the fluences (0.25-1.5) x 10(17) cm(-2) at ion current density of 4 mu A cm(-2). Then some of the samples were annealed at the temperatures close to the polymer glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree reasonably with those simulated using TRYDIN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. The changes in the polymer sheet resistance of the implanted and annealed samples were measured by standard two-point technique. The sheet

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JJ - Ostatní materiály

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments and Methods in Physics Research, Section B

ISSN

0168-583X

e-ISSN

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Svazek periodika

272

Číslo periodika v rámci svazku

20120201

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

396-399

Kód UT WoS článku

000301159900091

EID výsledku v databázi Scopus

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