Burying of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F15%3A43900797" target="_blank" >RIV/60461373:22310/15:43900797 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21230/14:00225020

Výsledek na webu

<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >http://dx.doi.org/10.1117/12.2070307</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >10.1117/12.2070307</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Burying of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Popis výsledku v původním jazyce

Two-step field-assisted ion-exchanged waveguides have been fabricated on a glass substrate. The concentration profiles of the exchanged ions were measured with electron microprobe. The waveguides were characterized under scanning electron microscope andoptical microscope for the investigation of burying structures. Guiding mode patterns were characterized with near-field measurement, where symmetric profiles were observed for the burying-type waveguide. The refractive index profiles were also measuredwith a modified end-fire coupling method. The relation between ion concentration profiles and index profiles were compared for the waveguides with different fabrication process.

Název v anglickém jazyce

Burying of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Popis výsledku anglicky

Two-step field-assisted ion-exchanged waveguides have been fabricated on a glass substrate. The concentration profiles of the exchanged ions were measured with electron microprobe. The waveguides were characterized under scanning electron microscope andoptical microscope for the investigation of burying structures. Guiding mode patterns were characterized with near-field measurement, where symmetric profiles were observed for the burying-type waveguide. The refractive index profiles were also measuredwith a modified end-fire coupling method. The relation between ion concentration profiles and index profiles were compared for the waveguides with different fabrication process.

Druh

D - Stať ve sborníku

CEP obor

CA - Anorganická chemie

OECD FORD obor

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Projekt

<a href="/cs/project/GBP108%2F12%2FG108" target="_blank" >GBP108/12/G108: Příprava, modifikace a charakterizace materiálů zářením</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE 9450, Photonics, Devices, and System VI

ISBN

978-1-62841-566-7

ISSN

0277-786X

e-ISSN

—

Počet stran výsledku

7

Strana od-do

"945015-1"-"945015-7"

Název nakladatele

SPIE

Místo vydání

Bellingham, Washington

Místo konání akce

Praha

Datum konání akce

27. 8. 2014

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000349404500040