"Burying" of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F14%3A00225020" target="_blank" >RIV/68407700:21230/14:00225020 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22310/15:43900797

Výsledek na webu

<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >http://dx.doi.org/10.1117/12.2070307</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >10.1117/12.2070307</a>

Jazyk výsledku

angličtina

Název v původním jazyce

"Burying" of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Popis výsledku v původním jazyce

Two-step field-assisted ion-exchanged waveguides have been fabricated on a glass substrate. The concentration profiles of the exchanged ions were measured with electron microprobe. The waveguides were characterized under scanning electron microscope and optical microscope for the investigation of burying structures. Guiding mode patterns were characterized with near-field measurement, where symmetric profiles were observed for the burying-type waveguide. The refractive index profiles were also measured with a modified end-fire coupling method. The relation between ion concentration profiles and index profiles were compared for the waveguides with different fabrication process.

Název v anglickém jazyce

"Burying" of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Popis výsledku anglicky

Two-step field-assisted ion-exchanged waveguides have been fabricated on a glass substrate. The concentration profiles of the exchanged ions were measured with electron microprobe. The waveguides were characterized under scanning electron microscope and optical microscope for the investigation of burying structures. Guiding mode patterns were characterized with near-field measurement, where symmetric profiles were observed for the burying-type waveguide. The refractive index profiles were also measured with a modified end-fire coupling method. The relation between ion concentration profiles and index profiles were compared for the waveguides with different fabrication process.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

PROCEEDINGS OF SPIE Vol. 9450

ISBN

978-1-62841-566-7

ISSN

—

e-ISSN

0277-786X

Počet stran výsledku

7

Strana od-do

—

Název nakladatele

SPIE

Místo vydání

Bellingham

Místo konání akce

Praha

Datum konání akce

27. 9. 2014

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000349404500040