Ionic diffusion and mass discrimination effects in the new generation of short flow tube SIFT-MS instruments

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F09%3A00329747" target="_blank" >RIV/61388955:_____/09:00329747 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Ionic diffusion and mass discrimination effects in the new generation of short flow tube SIFT-MS instruments

Popis výsledku v původním jazyce

The major thrust of this paper is to describe how the current selected ion flow tube mass spectrometry (SIFT-MS) Profile 3 instruments can be configured to provide reliable quantification of the trace gases present in air and exhaled breath by accountingfor the phenomena of differential diffusion of the analytical precursor and product ions in the flow tube reactor and mass discrimination in the ion sampling/analytical quadrupole mass spectrometer/detection system. If not accounted for these phenomena,especially the latter, can result in serious errors in quantification. Hence, it is described how H3O+ precursor ions are totally converted to a range of product ions within the mass-to-charge ratio, m/z, range from 18 to 201 and, thus, how the ion currents collected by the downstream ion sampling orifice disc and the count rates of these ions as determined by the analytical detection system at the various m/z are used to provide values ...

Název v anglickém jazyce

Ionic diffusion and mass discrimination effects in the new generation of short flow tube SIFT-MS instruments

Popis výsledku anglicky

The major thrust of this paper is to describe how the current selected ion flow tube mass spectrometry (SIFT-MS) Profile 3 instruments can be configured to provide reliable quantification of the trace gases present in air and exhaled breath by accountingfor the phenomena of differential diffusion of the analytical precursor and product ions in the flow tube reactor and mass discrimination in the ion sampling/analytical quadrupole mass spectrometer/detection system. If not accounted for these phenomena,especially the latter, can result in serious errors in quantification. Hence, it is described how H3O+ precursor ions are totally converted to a range of product ions within the mass-to-charge ratio, m/z, range from 18 to 201 and, thus, how the ion currents collected by the downstream ion sampling orifice disc and the count rates of these ions as determined by the analytical detection system at the various m/z are used to provide values ...

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F06%2F0776" target="_blank" >GA202/06/0776: Pokročilý výzkum a vývoj zdrojů nízkoteplotního plazmatu</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

International Journal of Mass Spectrometry

ISSN

1387-3806

e-ISSN

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Svazek periodika

281

Číslo periodika v rámci svazku

1-2

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

9

Strana od-do

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Kód UT WoS článku

000263756000003

EID výsledku v databázi Scopus

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