XPS and factor analysis study of initial stages of cerium oxide growth on polycrystalline tungsten

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F15%3A00448508" target="_blank" >RIV/61388955:_____/15:00448508 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68378271:_____/15:00448508

Výsledek na webu

<a href="http://dx.doi.org/10.1002/sia.5762" target="_blank" >http://dx.doi.org/10.1002/sia.5762</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/sia.5762" target="_blank" >10.1002/sia.5762</a>

Jazyk výsledku

angličtina

Název v původním jazyce

XPS and factor analysis study of initial stages of cerium oxide growth on polycrystalline tungsten

Popis výsledku v původním jazyce

The initial stages of growth of the nanostructured cerium oxide deposited on the polycrystalline tungsten surface by pulsed laser deposition are studied using XPS technique.The population of Ce (III) and Ce (IV)oxidation states in the deposited CeO 2-x layers is determined applying factor analysis method. Tungsten atoms react with oxygen from the cerium oxide nanoparticles already at the room temperature, and a layer of tungsten trioxide is formed at the interface.Gradual heating of the samples up to 900 K leads to the increase of the thickness of WO3 oxide layer and a partial reduction of Ce (IV) to Ce(III). The spectra of O (1s) photoelectrons are composed from a signal originating from metal oxides and a signal of surface superoxide and hydroxyl groups. Factor analysis was performed on the spectra of Ce (3d) photoelectrons to determine the position, shape, and intensity of the spectral components belonging to Ce (III) and Ce (IV) oxidation states.

Název v anglickém jazyce

XPS and factor analysis study of initial stages of cerium oxide growth on polycrystalline tungsten

Popis výsledku anglicky

The initial stages of growth of the nanostructured cerium oxide deposited on the polycrystalline tungsten surface by pulsed laser deposition are studied using XPS technique.The population of Ce (III) and Ce (IV)oxidation states in the deposited CeO 2-x layers is determined applying factor analysis method. Tungsten atoms react with oxygen from the cerium oxide nanoparticles already at the room temperature, and a layer of tungsten trioxide is formed at the interface.Gradual heating of the samples up to 900 K leads to the increase of the thickness of WO3 oxide layer and a partial reduction of Ce (IV) to Ce(III). The spectra of O (1s) photoelectrons are composed from a signal originating from metal oxides and a signal of surface superoxide and hydroxyl groups. Factor analysis was performed on the spectra of Ce (3d) photoelectrons to determine the position, shape, and intensity of the spectral components belonging to Ce (III) and Ce (IV) oxidation states.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

—

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Surface and Interface Analysis

ISSN

0142-2421

e-ISSN

—

Svazek periodika

47

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

9

Strana od-do

663-671

Kód UT WoS článku

000354183700004

EID výsledku v databázi Scopus

2-s2.0-84928929958