Emission of volatile degradation products from polymers irradiated with heavy ions to different fluences.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F02%3A49020031" target="_blank" >RIV/61389005:_____/02:49020031 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Emission of volatile degradation products from polymers irradiated with heavy ions to different fluences.

Popis výsledku v původním jazyce

Polyimide (Upilex), polyethyleneterephtalate, polystyrene and polyethylene were irradiated with 20-200 KeV C+, N+, F+, Ar and Xe+ ions to the fluences up to 10(17)cm(-2) and the depth profiles of hydrogen and oxygen atoms in the polymer surface layer were determined using standard Rutherford Back-Scattering (RBS) and Elastic Recoil Detection (ERD) techniques. The H and O depth profiles are structureless with no local extremes and with the concentration monotonically increasing from the sample surface tothe bulk value typical for pristine polymer. The H and O contents in the irradiated surface layer remain unchanged up to a criticll fluence, which is a decrasing function of the energy density deposited by an ion. Then they decline rather rapidly and converge to 50-70% of their original values of unirradiated polymer. The decline rate is roughly the same for all ion/polymer combinations regardless of the ion mass and energy.

Název v anglickém jazyce

Emission of volatile degradation products from polymers irradiated with heavy ions to different fluences.

Popis výsledku anglicky

Polyimide (Upilex), polyethyleneterephtalate, polystyrene and polyethylene were irradiated with 20-200 KeV C+, N+, F+, Ar and Xe+ ions to the fluences up to 10(17)cm(-2) and the depth profiles of hydrogen and oxygen atoms in the polymer surface layer were determined using standard Rutherford Back-Scattering (RBS) and Elastic Recoil Detection (ERD) techniques. The H and O depth profiles are structureless with no local extremes and with the concentration monotonically increasing from the sample surface tothe bulk value typical for pristine polymer. The H and O contents in the irradiated surface layer remain unchanged up to a criticll fluence, which is a decrasing function of the energy density deposited by an ion. Then they decline rather rapidly and converge to 50-70% of their original values of unirradiated polymer. The decline rate is roughly the same for all ion/polymer combinations regardless of the ion mass and energy.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

<a href="/cs/project/GA203%2F99%2F1626" target="_blank" >GA203/99/1626: Polymery modifikované iontovým svazkem pro tkáňové inženýrství</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Radiation effects and defects in solid

ISSN

1042-0150

e-ISSN

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Svazek periodika

155

Číslo periodika v rámci svazku

1-4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

195-202

Kód UT WoS článku

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EID výsledku v databázi Scopus

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