The characterization of PEEK, PET and PI implanted with Co ions to high fluences

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F13%3A00393346" target="_blank" >RIV/61389005:_____/13:00393346 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389013:_____/13:00393346 RIV/60461373:22310/13:43896639 RIV/44555601:13440/13:43884983

Výsledek na webu

<a href="http://ac.els-cdn.com/S0169433212022222/1-s2.0-S0169433212022222-main.pdf?_tid=dbf9e606-df24-11e2-b873-00000aacb35d&acdnat=1372336197_4b4233224d734b70b85eb71d11862e0c" target="_blank" >http://ac.els-cdn.com/S0169433212022222/1-s2.0-S0169433212022222-main.pdf?_tid=dbf9e606-df24-11e2-b873-00000aacb35d&acdnat=1372336197_4b4233224d734b70b85eb71d11862e0c</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2012.12.071" target="_blank" >10.1016/j.apsusc.2012.12.071</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The characterization of PEEK, PET and PI implanted with Co ions to high fluences

Popis výsledku v původním jazyce

Polyimide (PI), polyetheretherketone (PEEK), and polyethylene terephthalate (PET) foils have been implanted with 40 keV Co+ ions at room temperature to the fluences ranging from 0.2 x 10(16) cm(-2) to 1.0 x 10(17) cm(-2). Co depth profiles determined byRBS have been compared to SRIM 2008 calculations. The measured projected ranges RP differ slightly from the SRIM simulation because of the compositional changes in polymers implanted to high fluences; especially the widths of the Co profiles are much larger than those simulated by SRIM. Oxygen and hydrogen depletion has been examined using the RBS and ERDA techniques. The surface morphology of the implanted polymers has been characterized using AFM. The PET polymer exhibits lower oxygen escape than thePI and PEEK, but the surface roughness at PET has been affected most significantly after the implantation. Implanted Co atoms tend to aggregate into nanoparticles, the size and distribution of which has been determined from TEM micrograph

Název v anglickém jazyce

The characterization of PEEK, PET and PI implanted with Co ions to high fluences

Popis výsledku anglicky

Polyimide (PI), polyetheretherketone (PEEK), and polyethylene terephthalate (PET) foils have been implanted with 40 keV Co+ ions at room temperature to the fluences ranging from 0.2 x 10(16) cm(-2) to 1.0 x 10(17) cm(-2). Co depth profiles determined byRBS have been compared to SRIM 2008 calculations. The measured projected ranges RP differ slightly from the SRIM simulation because of the compositional changes in polymers implanted to high fluences; especially the widths of the Co profiles are much larger than those simulated by SRIM. Oxygen and hydrogen depletion has been examined using the RBS and ERDA techniques. The surface morphology of the implanted polymers has been characterized using AFM. The PET polymer exhibits lower oxygen escape than thePI and PEEK, but the surface roughness at PET has been affected most significantly after the implantation. Implanted Co atoms tend to aggregate into nanoparticles, the size and distribution of which has been determined from TEM micrograph

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

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Svazek periodika

275

Číslo periodika v rámci svazku

JUN 15

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

311-315

Kód UT WoS článku

000318977300050

EID výsledku v databázi Scopus

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