Picosecond relaxation of X-ray excited GaAs
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F17%3A00508745" target="_blank" >RIV/61389021:_____/17:00508745 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68378271:_____/17:00487394
Výsledek na webu
<a href="https://www.sciencedirect.com/science/article/abs/pii/S1574181817300605?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/abs/pii/S1574181817300605?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.hedp.2017.05.012" target="_blank" >10.1016/j.hedp.2017.05.012</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Picosecond relaxation of X-ray excited GaAs
Popis výsledku v původním jazyce
In this paper we present the current status of our theoretical studies on ultrafast relaxation of X-ray/XUV excited gallium arsenide. First, we discuss our previous approach, the unified model based on rate equations, two-temperature model and the extended Drude approach. By fitting the model to the available experimental data, we obtained realistic estimates on transient electronic temperature and electron-lattice thermalization timescale. Next, we make a step towards a rigorous description of the relaxation process with our hybrid code, XTANT. We extend the XTANT to include the band-specific effect of the suppression of collisional processes in GaAs, and perform dedicated simulations. We find that the extended model correctly describes the predicted transient non-isothermality of conduction and valence bands, however, currently, it cannot reproduce the experimentally observed reflectivity overshooting at 5-10 ps. The reason for this discrepancy is that the electron-phonon coupling rate implemented in XTANT, although successfully applied for diamond and silicon, clearly underestimates the strength of this coupling in GaAs. The outline for a respective model improvement is discussed.
Název v anglickém jazyce
Picosecond relaxation of X-ray excited GaAs
Popis výsledku anglicky
In this paper we present the current status of our theoretical studies on ultrafast relaxation of X-ray/XUV excited gallium arsenide. First, we discuss our previous approach, the unified model based on rate equations, two-temperature model and the extended Drude approach. By fitting the model to the available experimental data, we obtained realistic estimates on transient electronic temperature and electron-lattice thermalization timescale. Next, we make a step towards a rigorous description of the relaxation process with our hybrid code, XTANT. We extend the XTANT to include the band-specific effect of the suppression of collisional processes in GaAs, and perform dedicated simulations. We find that the extended model correctly describes the predicted transient non-isothermality of conduction and valence bands, however, currently, it cannot reproduce the experimentally observed reflectivity overshooting at 5-10 ps. The reason for this discrepancy is that the electron-phonon coupling rate implemented in XTANT, although successfully applied for diamond and silicon, clearly underestimates the strength of this coupling in GaAs. The outline for a respective model improvement is discussed.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10306 - Optics (including laser optics and quantum optics)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2017
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
High energy density physics
ISSN
1574-1818
e-ISSN
—
Svazek periodika
24
Číslo periodika v rámci svazku
September
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
7
Strana od-do
15-21
Kód UT WoS článku
000410831800003
EID výsledku v databázi Scopus
2-s2.0-85020308135