Mueller matrix ellipsometry of waveplates for control of their properties and alignment

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F20%3A10243448" target="_blank" >RIV/61989100:27640/20:10243448 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27740/20:10243448

Výsledek na webu

<a href="https://avs.scitation.org/doi/10.1116/1.5129615" target="_blank" >https://avs.scitation.org/doi/10.1116/1.5129615</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1116/1.5129615" target="_blank" >10.1116/1.5129615</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Mueller matrix ellipsometry of waveplates for control of their properties and alignment

Popis výsledku v původním jazyce

In this paper, the authors characterize high-order quartz waveplates in the wide spectral range (from 193 to 1700 nm) using a commercial Mueller matrix ellipsometer RC2-DI-Woollam. They demonstrate that Mueller matrix ellipsometry is a powerful tool to obtain the waveplate retardation in a wide spectral range together with azimuthal angles of optical axes with good accuracy. Moreover, they deal with depolarization caused by a finite monochromator bandwidth, which is included in the model using incoherent averaging of Mueller matrices. The application of Lu-Chipman Mueller matrix decomposition to extract depolarization from data is also demonstrated. Finally, Lu-Chipman decomposition is used to demonstrate the presence of the optical activity in quartz, which one may misinterpret with incorrect alignment of the waveplate azimuth angle. (C) 2019 Author(s).

Název v anglickém jazyce

Mueller matrix ellipsometry of waveplates for control of their properties and alignment

Popis výsledku anglicky

In this paper, the authors characterize high-order quartz waveplates in the wide spectral range (from 193 to 1700 nm) using a commercial Mueller matrix ellipsometer RC2-DI-Woollam. They demonstrate that Mueller matrix ellipsometry is a powerful tool to obtain the waveplate retardation in a wide spectral range together with azimuthal angles of optical axes with good accuracy. Moreover, they deal with depolarization caused by a finite monochromator bandwidth, which is included in the model using incoherent averaging of Mueller matrices. The application of Lu-Chipman Mueller matrix decomposition to extract depolarization from data is also demonstrated. Finally, Lu-Chipman decomposition is used to demonstrate the presence of the optical activity in quartz, which one may misinterpret with incorrect alignment of the waveplate azimuth angle. (C) 2019 Author(s).

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

ISSN

2166-2746

e-ISSN

—

Svazek periodika

38

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

—

Kód UT WoS článku

000569097500022

EID výsledku v databázi Scopus

2-s2.0-85077087935