Closed-form approximation of symmetric thin-film multi-layer plasmonic dispersion equation solutions

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27740%2F21%3A10247197" target="_blank" >RIV/61989100:27740/21:10247197 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-29-4-5741&id=447543" target="_blank" >https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-29-4-5741&id=447543</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.415870" target="_blank" >10.1364/OE.415870</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Closed-form approximation of symmetric thin-film multi-layer plasmonic dispersion equation solutions

Popis výsledku v původním jazyce

An original asymptotic method is developed and used to find closed-form approximations to the symmetric thin-film three- and multi-layer plasmonic dispersion equations. Closed-form analysis of three-layer metal-insulator-metal (MIM: &quot;M&quot; is metal and &quot;I&quot; is insulator) and IMI devices shows a complementary physics underpinning their properties. Analysis of multi-layer symmetric devices, considered for a seven-layer MIMIMIM example, uncovers a remarkable departure from the physics governing MIM and IMI features. Multi-layer propagation length and attenuation are determined by proximity, in the space of cladding thickness and wavelength, to singularities that exist in the limit of vanishing imaginary part of the cladding dielectric constant. Exploitation of this phenomenon will expand the development of a broader range of thin-film applications in optoelectronics.

Název v anglickém jazyce

Closed-form approximation of symmetric thin-film multi-layer plasmonic dispersion equation solutions

Popis výsledku anglicky

An original asymptotic method is developed and used to find closed-form approximations to the symmetric thin-film three- and multi-layer plasmonic dispersion equations. Closed-form analysis of three-layer metal-insulator-metal (MIM: &quot;M&quot; is metal and &quot;I&quot; is insulator) and IMI devices shows a complementary physics underpinning their properties. Analysis of multi-layer symmetric devices, considered for a seven-layer MIMIMIM example, uncovers a remarkable departure from the physics governing MIM and IMI features. Multi-layer propagation length and attenuation are determined by proximity, in the space of cladding thickness and wavelength, to singularities that exist in the limit of vanishing imaginary part of the cladding dielectric constant. Exploitation of this phenomenon will expand the development of a broader range of thin-film applications in optoelectronics.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/EF16_013%2F0001791" target="_blank" >EF16_013/0001791: IT4Innovations národní superpočítačové centrum - cesta k exascale</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Express

ISSN

1094-4087

e-ISSN

—

Svazek periodika

29

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

14

Strana od-do

5741-5754

Kód UT WoS článku

000619209800085

EID výsledku v databázi Scopus

2-s2.0-85100717472