Electromigration and Polarization in Schottky Contacts CdTe Based Compounds

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F19%3A00509821" target="_blank" >RIV/68081723:_____/19:00509821 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216208:11320/19:10399568

Výsledek na webu

<a href="https://ajnsa.journals.ekb.eg/article_27020_c2d2e8fcadc0ec801b110c4c6982b6d4.pdf" target="_blank" >https://ajnsa.journals.ekb.eg/article_27020_c2d2e8fcadc0ec801b110c4c6982b6d4.pdf</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.21608/ajnsa.2019.7088.1165" target="_blank" >10.21608/ajnsa.2019.7088.1165</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Electromigration and Polarization in Schottky Contacts CdTe Based Compounds

Popis výsledku v původním jazyce

In this work, studies of major transient phenomena, electromigration and polarization, are presented. Electromigration measurements have been carried out at different temperatures on low resistivity p-type CdTe sample with two Au Schottky contacts. Comparative measurements at different temperatures succeeded by etching the anode contact and a thin later below after each measurement and making a new contact. Temporal conductance of the depletion layer was measured and mobility, acceptor concentrations, diffusion coefficients of the mobile ions and the activation energy of the electromigration process were extracted. Pockels effect technique has been used to study the polarization effect in high resistivity CdZnTe with Au Schottky contacts. Time dependence of Pockels effect measurements was assessed at different temperatures. The analysis of these data revealed that the energy of the deep donor level responsible for the polarization effect in the studied sample is Ec-0.8771eV, with capture cross section 8.71x10(-13) cm(2).

Název v anglickém jazyce

Electromigration and Polarization in Schottky Contacts CdTe Based Compounds

Popis výsledku anglicky

In this work, studies of major transient phenomena, electromigration and polarization, are presented. Electromigration measurements have been carried out at different temperatures on low resistivity p-type CdTe sample with two Au Schottky contacts. Comparative measurements at different temperatures succeeded by etching the anode contact and a thin later below after each measurement and making a new contact. Temporal conductance of the depletion layer was measured and mobility, acceptor concentrations, diffusion coefficients of the mobile ions and the activation energy of the electromigration process were extracted. Pockels effect technique has been used to study the polarization effect in high resistivity CdZnTe with Au Schottky contacts. Time dependence of Pockels effect measurements was assessed at different temperatures. The analysis of these data revealed that the energy of the deep donor level responsible for the polarization effect in the studied sample is Ec-0.8771eV, with capture cross section 8.71x10(-13) cm(2).

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ARAB JOURNAL OF NUCLEAR SCIENCES AND APPLICATIONS

ISSN

1110-0451

e-ISSN

—

Svazek periodika

52

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

EG - Egyptská arabská republika

Počet stran výsledku

6

Strana od-do

13-18

Kód UT WoS článku

000464972800003

EID výsledku v databázi Scopus

—