The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F21%3A00542399" target="_blank" >RIV/68081723:_____/21:00542399 - isvavai.cz</a>
Výsledek na webu
<a href="https://www.sciencedirect.com/science/article/pii/S0304399121000826?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0304399121000826?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2021.113294" target="_blank" >10.1016/j.ultramic.2021.113294</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry
Popis výsledku v původním jazyce
Performing EBSD with a horizontal sample and a parallel EBSD detector sensor, enables safer specimen movements for data collection of large specimen areas and improves the longitudinal spatial resolution. The collection of electron backscattering patterns (EBSPs) at normal incidence to the electron beam has been revisited via the use of a direct electron detection (DED) sensor. In this article we present a fully operational DED EBSD detection system in this geometry, referred to as the tilt-free geometry. A well-defined Σ=3[101]{121} twin boundary in a Molybdenum bicrystal was used to measure the physical spatial resolution of the EBSD detector in this tilt-free geometry. In this study, two separate methods for estimating the spatial resolution of EBSD, one based on a pattern quality metric and the other on a normalised cross correlation coefficient were used. The spatial resolution was determined at accelerating voltages of 8 kV, 10 kV, 12 kV, 15 kV and 20 kV ranging from ~22−38 nm using the pattern quality method and ~31−46 nm using the normalised cross correlation method.
Název v anglickém jazyce
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry
Popis výsledku anglicky
Performing EBSD with a horizontal sample and a parallel EBSD detector sensor, enables safer specimen movements for data collection of large specimen areas and improves the longitudinal spatial resolution. The collection of electron backscattering patterns (EBSPs) at normal incidence to the electron beam has been revisited via the use of a direct electron detection (DED) sensor. In this article we present a fully operational DED EBSD detection system in this geometry, referred to as the tilt-free geometry. A well-defined Σ=3[101]{121} twin boundary in a Molybdenum bicrystal was used to measure the physical spatial resolution of the EBSD detector in this tilt-free geometry. In this study, two separate methods for estimating the spatial resolution of EBSD, one based on a pattern quality metric and the other on a normalised cross correlation coefficient were used. The spatial resolution was determined at accelerating voltages of 8 kV, 10 kV, 12 kV, 15 kV and 20 kV ranging from ~22−38 nm using the pattern quality method and ~31−46 nm using the normalised cross correlation method.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20501 - Materials engineering
Návaznosti výsledku
Projekt
<a href="/cs/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2021
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Ultramicroscopy
ISSN
0304-3991
e-ISSN
1879-2723
Svazek periodika
226
Číslo periodika v rámci svazku
JUL
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
9
Strana od-do
113294
Kód UT WoS článku
000661167900004
EID výsledku v databázi Scopus
2-s2.0-85105592949