Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F25%3A00642796" target="_blank" >RIV/68081723:_____/25:00642796 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68081731:_____/25:00642796 RIV/00216305:26620/26:0197904
Výsledek na webu
<a href="https://pubs.acs.org/doi/10.1021/acsomega.4c10081" target="_blank" >https://pubs.acs.org/doi/10.1021/acsomega.4c10081</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1021/acsomega.4c10081" target="_blank" >10.1021/acsomega.4c10081</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications
Popis výsledku v původním jazyce
The aim of this work was to study the dielectric properties of dot capacitors composed of a microtip coated with a thin layer of epoxy resin bonded to a steel plate. Two microtips with radii ranging from 3 to 5 mu m were fabricated via electrochemical etching and coated with an epoxy layer 27-35 mu m in thickness. The microtips were characterized by scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDS). This study showed that composite cold-field emission emitters behave as dot capacitors. The real and imaginary parts of the impedance and permittivity, along with the direct and alternating conductivities, activation energies, and hopping energies, were examined. These evaluations were conducted at temperatures of 30, 45, 60, 75, and 90 degrees C, with a frequency range of 1 to 106 Hz using impedance spectroscopy. The results indicated that both the impedance and electrical permittivity decreased slightly with increasing temperature, whereas the AC conductivity was independent of temperature. Additionally, a decrease in the activation and jump energies was observed as the thickness of the epoxy layer increased. The low values of the activation and hopping energies facilitated electron transport through the epoxy layer. The modified hopping model also provides an explanation for the conduction mechanism through the epoxy layer. The Nyquist plot shows that the capacitance decreased with increasing temperature. A slight increase in relaxation time was also observed, indicating the onset of conductive pathway formation. These findings contribute to a better understanding of the capacitance of the composite emitters and the formation of conductive pathways.
Název v anglickém jazyce
Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications
Popis výsledku anglicky
The aim of this work was to study the dielectric properties of dot capacitors composed of a microtip coated with a thin layer of epoxy resin bonded to a steel plate. Two microtips with radii ranging from 3 to 5 mu m were fabricated via electrochemical etching and coated with an epoxy layer 27-35 mu m in thickness. The microtips were characterized by scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDS). This study showed that composite cold-field emission emitters behave as dot capacitors. The real and imaginary parts of the impedance and permittivity, along with the direct and alternating conductivities, activation energies, and hopping energies, were examined. These evaluations were conducted at temperatures of 30, 45, 60, 75, and 90 degrees C, with a frequency range of 1 to 106 Hz using impedance spectroscopy. The results indicated that both the impedance and electrical permittivity decreased slightly with increasing temperature, whereas the AC conductivity was independent of temperature. Additionally, a decrease in the activation and jump energies was observed as the thickness of the epoxy layer increased. The low values of the activation and hopping energies facilitated electron transport through the epoxy layer. The modified hopping model also provides an explanation for the conduction mechanism through the epoxy layer. The Nyquist plot shows that the capacitance decreased with increasing temperature. A slight increase in relaxation time was also observed, indicating the onset of conductive pathway formation. These findings contribute to a better understanding of the capacitance of the composite emitters and the formation of conductive pathways.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
ACS Omega
ISSN
2470-1343
e-ISSN
2470-1343
Svazek periodika
10
Číslo periodika v rámci svazku
11
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
11
Strana od-do
11108-11118
Kód UT WoS článku
001445733600001
EID výsledku v databázi Scopus
2-s2.0-105001082693