A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00436864" target="_blank" >RIV/68081731:_____/15:00436864 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.ultramic.2014.09.002" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2014.09.002</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ultramic.2014.09.002" target="_blank" >10.1016/j.ultramic.2014.09.002</a>

Jazyk výsledku

angličtina

Název v původním jazyce

A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs

Popis výsledku v původním jazyce

Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique which uses low energy electrons while providing a very good image resolution. Reflectivity of very slow electrons in the range 0?30 eV can be correlated with the electronic structureof the material, aiming at the determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to pre-process the image data depending on the beam energy as the third dimension. The crucial task is to detect grain boundaries in polycrystals and evaluate the image signal in connection to the energy of electron impact. Recent algorithms performing the task for the traditional EBSD method are not suitable as they do not address the side-effects of the SLEEM technique. We propose a method that detects the grain boundaries while correcting for image distortion caused by the variation of cathode lens strength, and for several other issues.

Název v anglickém jazyce

A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs

Popis výsledku anglicky

Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique which uses low energy electrons while providing a very good image resolution. Reflectivity of very slow electrons in the range 0?30 eV can be correlated with the electronic structureof the material, aiming at the determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to pre-process the image data depending on the beam energy as the third dimension. The crucial task is to detect grain boundaries in polycrystals and evaluate the image signal in connection to the energy of electron impact. Recent algorithms performing the task for the traditional EBSD method are not suitable as they do not address the side-effects of the SLEEM technique. We propose a method that detects the grain boundaries while correcting for image distortion caused by the variation of cathode lens strength, and for several other issues.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/LO1212" target="_blank" >LO1212: ALISI - Centrum pokročilých diagnostických metod a technologií</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Ultramicroscopy

ISSN

0304-3991

e-ISSN

—

Svazek periodika

148

Číslo periodika v rámci svazku

JAN 2015

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

52-56

Kód UT WoS článku

000345973000007

EID výsledku v databázi Scopus

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