Study of multi-layered graphene by ultra-low energy SEM/STEM

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00459573" target="_blank" >RIV/68081731:_____/16:00459573 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.diamond.2015.12.012" target="_blank" >http://dx.doi.org/10.1016/j.diamond.2015.12.012</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.diamond.2015.12.012" target="_blank" >10.1016/j.diamond.2015.12.012</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Study of multi-layered graphene by ultra-low energy SEM/STEM

Popis výsledku v původním jazyce

Scanning electron microscopy with very slow electrons offers a novel tool enabling one to image the graphene samples at nanometer or even sub-nanometer lateral resolution in transmitted as well as reflected electrons and to count reliably the atomic layers in both imaging modes. The study was performed on graphene prepared by chemical vapor deposition on thin copper foil. Observation by slow electrons has also confirmed the underlayer mechanism of nucleation and growth bellow already existing graphene layers on copper. Moreover, electrons with impacted energy below 100 eV can be used for "cleaning" of a material. It leads to elimination of the contamination process during the measurement, which enables to observe the predicted oscillations in reflection mode and to measure the transmissivity of various stacks of layers in transmission mode down to units of eV.

Název v anglickém jazyce

Study of multi-layered graphene by ultra-low energy SEM/STEM

Popis výsledku anglicky

Scanning electron microscopy with very slow electrons offers a novel tool enabling one to image the graphene samples at nanometer or even sub-nanometer lateral resolution in transmitted as well as reflected electrons and to count reliably the atomic layers in both imaging modes. The study was performed on graphene prepared by chemical vapor deposition on thin copper foil. Observation by slow electrons has also confirmed the underlayer mechanism of nucleation and growth bellow already existing graphene layers on copper. Moreover, electrons with impacted energy below 100 eV can be used for "cleaning" of a material. It leads to elimination of the contamination process during the measurement, which enables to observe the predicted oscillations in reflection mode and to measure the transmissivity of various stacks of layers in transmission mode down to units of eV.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Diamond and Related Materials

ISSN

0925-9635

e-ISSN

—

Svazek periodika

63

Číslo periodika v rámci svazku

March 2016

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

7

Strana od-do

136-142

Kód UT WoS článku

000371942700025

EID výsledku v databázi Scopus

2-s2.0-84959251388