STEM modes in SEM – simulations and experiments

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00481585" target="_blank" >RIV/68081731:_____/17:00481585 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

STEM modes in SEM – simulations and experiments

Popis výsledku v původním jazyce

The semiconductor STEM detector in the Magellan 400 FEG SEM microscope (www.fei.com) is used to detect transmitted electrons (TE) and allows observing samples in four imaging modes. Two modes of objective lens, namely HR (high resolution) and UHR (ultra high resolution), differ by their resolution and by the presence or absence of a magnetic field around the sample. If the deceleration mode is chosen, cathode lens (CL) field is added, and two further microscope modes can be obtained. The aim of this work is to study the trajectories of the TEs in each mode with regard to their angular and energy distribution. The HR and HR + CL mode is without magnetic field around the sample, for that reason the electrons retain their angular information. In addition, the electrostatic field between the sample and the STEM detector collimates the electrons towards the optical axis. We can detect TEs emitted at a large polar angles with respect to the optical axis. On the other hand, for UHR and UHR + CL modes, the sample is placed in a strong magnetic field. The electrons under the influence of the magnetic field have spiral trajectories and can cross the optical axis plane several times during their path to the detector, thus angular information is not simply interpretable.

Název v anglickém jazyce

STEM modes in SEM – simulations and experiments

Popis výsledku anglicky

The semiconductor STEM detector in the Magellan 400 FEG SEM microscope (www.fei.com) is used to detect transmitted electrons (TE) and allows observing samples in four imaging modes. Two modes of objective lens, namely HR (high resolution) and UHR (ultra high resolution), differ by their resolution and by the presence or absence of a magnetic field around the sample. If the deceleration mode is chosen, cathode lens (CL) field is added, and two further microscope modes can be obtained. The aim of this work is to study the trajectories of the TEs in each mode with regard to their angular and energy distribution. The HR and HR + CL mode is without magnetic field around the sample, for that reason the electrons retain their angular information. In addition, the electrostatic field between the sample and the STEM detector collimates the electrons towards the optical axis. We can detect TEs emitted at a large polar angles with respect to the optical axis. On the other hand, for UHR and UHR + CL modes, the sample is placed in a strong magnetic field. The electrons under the influence of the magnetic field have spiral trajectories and can cross the optical axis plane several times during their path to the detector, thus angular information is not simply interpretable.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

13th Multinational Congress on Microscopy: Book of Abstracts

ISBN

978-953-7941-19-2

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

140-141

Název nakladatele

Ruder Bošković Institute, Croatian Microscopy Society

Místo vydání

Zagreb

Místo konání akce

Rovinj

Datum konání akce

24. 9. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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