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Trip steel specimen preparation for advanced sem and EBSD

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00536988" target="_blank" >RIV/68081731:_____/20:00536988 - isvavai.cz</a>

  • Výsledek na webu

    <a href="http://dx.doi.org/10.37904/metal.2020.3513" target="_blank" >http://dx.doi.org/10.37904/metal.2020.3513</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.37904/metal.2020.3513" target="_blank" >10.37904/metal.2020.3513</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Trip steel specimen preparation for advanced sem and EBSD

  • Popis výsledku v původním jazyce

    Modern scanning electron microscopy (SEM) allows observations of specimens with high surface sensitivity. The surface sensitivity is significantly affected by the accelerating voltages. With the development of the scanning electron microscopy, the requirements for the surface quality of samples increase. Metallographic methods originally intended for light microscopy become insufficient. The problem occurs especially with multiphase materials having a fine-grained structure. The investigated TRIP steel consists of a ferritic-bainitic matrix, retained austenite and martensite phases. The sizes of the smallest phases are nanometer units. The volume of residual austenite was determined by X-ray diffraction. The basic preparation of all tested samples involved conventional metallographic grinding and very fine mechanical polishing. One sample was analysed in this state. Other samples were subsequently chemically polished, electropolished and chemical-mechanically polished. The specimens were observed in the SEM using a SE and a BSE detector at low energies immediately after the preparation. An EBSD was performed in the same areas to characterize the retained austenite. Topographical imaging by special AFM, integrated into the SEM, demonstrated that the mechanical polishing results in surface deformation and residual austenite is transformed. All other methods have their specifics and for modern sensitive SEM instruments it is necessary to optimize individual procedures.

  • Název v anglickém jazyce

    Trip steel specimen preparation for advanced sem and EBSD

  • Popis výsledku anglicky

    Modern scanning electron microscopy (SEM) allows observations of specimens with high surface sensitivity. The surface sensitivity is significantly affected by the accelerating voltages. With the development of the scanning electron microscopy, the requirements for the surface quality of samples increase. Metallographic methods originally intended for light microscopy become insufficient. The problem occurs especially with multiphase materials having a fine-grained structure. The investigated TRIP steel consists of a ferritic-bainitic matrix, retained austenite and martensite phases. The sizes of the smallest phases are nanometer units. The volume of residual austenite was determined by X-ray diffraction. The basic preparation of all tested samples involved conventional metallographic grinding and very fine mechanical polishing. One sample was analysed in this state. Other samples were subsequently chemically polished, electropolished and chemical-mechanically polished. The specimens were observed in the SEM using a SE and a BSE detector at low energies immediately after the preparation. An EBSD was performed in the same areas to characterize the retained austenite. Topographical imaging by special AFM, integrated into the SEM, demonstrated that the mechanical polishing results in surface deformation and residual austenite is transformed. All other methods have their specifics and for modern sensitive SEM instruments it is necessary to optimize individual procedures.

Klasifikace

  • Druh

    D - Stať ve sborníku

  • CEP obor

  • OECD FORD obor

    20501 - Materials engineering

Návaznosti výsledku

  • Projekt

    <a href="/cs/project/TN01000008" target="_blank" >TN01000008: Centrum elektronové a fotonové optiky</a><br>

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2020

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název statě ve sborníku

    METAL 2020. 29th International Conference on Metallurgy and Materials. Proceedings

  • ISBN

    978-80-87294-97-0

  • ISSN

    2694-9296

  • e-ISSN

  • Počet stran výsledku

    5

  • Strana od-do

    518-522

  • Název nakladatele

    TANGER

  • Místo vydání

    Ostrava

  • Místo konání akce

    Brno

  • Datum konání akce

    20. 5. 2020

  • Typ akce podle státní příslušnosti

    WRD - Celosvětová akce

  • Kód UT WoS článku

    000794331100082