Study of secondary phases in trip steel by advanced sem and afm techniques

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00536989" target="_blank" >RIV/68081731:_____/20:00536989 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.37904/metal.2020.3516" target="_blank" >http://dx.doi.org/10.37904/metal.2020.3516</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.37904/metal.2020.3516" target="_blank" >10.37904/metal.2020.3516</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Study of secondary phases in trip steel by advanced sem and afm techniques

Popis výsledku v původním jazyce

The paper aims to demonstrate a modern scanning electron microscope (SEM) as a powerful tool for visualization of the secondary phases in TRIP steel. The TRIP steel specimens prepared by various metallographic techniques were imaged by the SEM and the secondary phases presence was confirmed by an electron back-scattered diffraction (EBSD) technique. The chemical polishing by 5 % HF in H2O2 for 10 seconds results in selective etching for each individual phase, as confirmed by an atomic force microscopy (AFM) and hybrid AFM-in-SEM techniques. The phases are easily distinguishable in the SEM micrographs created by the low energy high take-off angle signal electrons. The proposed sample preparation technique together with special SEM imaging conditions enables us accurate analysis of distribution of secondary phases within the TRIP steel matrix and moreover, the retained austenite is distinguishable from the martensite phase.

Název v anglickém jazyce

Study of secondary phases in trip steel by advanced sem and afm techniques

Popis výsledku anglicky

The paper aims to demonstrate a modern scanning electron microscope (SEM) as a powerful tool for visualization of the secondary phases in TRIP steel. The TRIP steel specimens prepared by various metallographic techniques were imaged by the SEM and the secondary phases presence was confirmed by an electron back-scattered diffraction (EBSD) technique. The chemical polishing by 5 % HF in H2O2 for 10 seconds results in selective etching for each individual phase, as confirmed by an atomic force microscopy (AFM) and hybrid AFM-in-SEM techniques. The phases are easily distinguishable in the SEM micrographs created by the low energy high take-off angle signal electrons. The proposed sample preparation technique together with special SEM imaging conditions enables us accurate analysis of distribution of secondary phases within the TRIP steel matrix and moreover, the retained austenite is distinguishable from the martensite phase.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

<a href="/cs/project/TN01000008" target="_blank" >TN01000008: Centrum elektronové a fotonové optiky</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

METAL 2020. 29th International Conference on Metallurgy and Materials. Proceedings

ISBN

978-80-87294-97-0

ISSN

2694-9296

e-ISSN

—

Počet stran výsledku

6

Strana od-do

533-538

Název nakladatele

TANGER

Místo vydání

Ostrava

Místo konání akce

Brno

Datum konání akce

20. 5. 2020

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000794331100085