Advances in atomic resolution secondary electron imaging

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F25%3A00618628" target="_blank" >RIV/68081731:_____/25:00618628 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.epjap.org/articles/epjap/full_html/2025/01/ap20240165/ap20240165.html" target="_blank" >https://www.epjap.org/articles/epjap/full_html/2025/01/ap20240165/ap20240165.html</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1051/epjap/2025007" target="_blank" >10.1051/epjap/2025007</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Advances in atomic resolution secondary electron imaging

Popis výsledku v původním jazyce

We have developed an efficient detector of secondary electrons (SEs) for a high-performance scanning transmission electron microscope (STEM) and tested it on several materials. Using the detector at 60 keV, we resolved the nearest neighbor atoms separated by 0.142 nm in SE images of graphene, and detected single-atom substitutions in graphene and monolayer MoS2. We imaged single heavy atoms on an amorphous carbon thin film, and the surface structure of gold nanoparticles supported on a thin film as well as on a bulk substrate. Other application examples shown in this paper include SE imaging combined with 4D STEM, simultaneous SE and electron energy loss spectroscopy (EELS) imaging, and simultaneous imaging of entrance and exit sides of a sample using two separate SE detectors. The results point to an exciting future for atomic-resolution SE imaging.

Název v anglickém jazyce

Advances in atomic resolution secondary electron imaging

Popis výsledku anglicky

We have developed an efficient detector of secondary electrons (SEs) for a high-performance scanning transmission electron microscope (STEM) and tested it on several materials. Using the detector at 60 keV, we resolved the nearest neighbor atoms separated by 0.142 nm in SE images of graphene, and detected single-atom substitutions in graphene and monolayer MoS2. We imaged single heavy atoms on an amorphous carbon thin film, and the surface structure of gold nanoparticles supported on a thin film as well as on a bulk substrate. Other application examples shown in this paper include SE imaging combined with 4D STEM, simultaneous SE and electron energy loss spectroscopy (EELS) imaging, and simultaneous imaging of entrance and exit sides of a sample using two separate SE detectors. The results point to an exciting future for atomic-resolution SE imaging.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/GA21-13541S" target="_blank" >GA21-13541S: Kvantitativní nízkoenergiové 4D-STEM zobrazování radiačně citlivých vzorků</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

European Physical Journal-Applied Physics

ISSN

1286-0042

e-ISSN

1286-0050

Svazek periodika

100

Číslo periodika v rámci svazku

20 March

Stát vydavatele periodika

FR - Francouzská republika

Počet stran výsledku

10

Strana od-do

9

Kód UT WoS článku

001448026800001

EID výsledku v databázi Scopus

2-s2.0-105001182196