Surface Morphology and Ablation Efficiency in UV Ultrafast Laser Micromachining of Fused Silica
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F25%3A00643242" target="_blank" >RIV/68081731:_____/25:00643242 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/00216305:26210/26:0199441
Výsledek na webu
<a href="https://journalmt.com/artkey/mft-202504-0012_surface-morphology-and-ablation-efficiency-in-duv-ultrafast-laser-micromachining-of-fused-silica.php" target="_blank" >https://journalmt.com/artkey/mft-202504-0012_surface-morphology-and-ablation-efficiency-in-duv-ultrafast-laser-micromachining-of-fused-silica.php</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.21062/mft.2025.057" target="_blank" >10.21062/mft.2025.057</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Surface Morphology and Ablation Efficiency in UV Ultrafast Laser Micromachining of Fused Silica
Popis výsledku v původním jazyce
Fused silica is a key material for high-precision applications such as micro-optics and microfluidics. One route to improving direct laser writing (DLW) of fused silica is the use of shorter laser wavelengths, which enable tighter focusing and enhanced absorption. In this study, the influence of process parameters on surface quality and material removal during DLW using a deep ultraviolet (DUV) ultrafast laser (257 nm, 1 ps) was investigated. A full-factorial design of the experiment was used to identify conditions that optimise both surface quality and ablation efficiency. Surface roughness as low as S-a approximate to 200 nm and material removal rates up to 0.048 mm(3).min(-1) were achieved. Conditions that led to surface degradation were also identified. Finally, the optimised parameters were applied to fabricate a microfluidic demonstrator. These results confirm that DUV ultrafast DLW is a powerful technique for fabricating high-fidelity features in fused silica with exceptional precision and quality that can be used for micro-optics or microfluidics devices.
Název v anglickém jazyce
Surface Morphology and Ablation Efficiency in UV Ultrafast Laser Micromachining of Fused Silica
Popis výsledku anglicky
Fused silica is a key material for high-precision applications such as micro-optics and microfluidics. One route to improving direct laser writing (DLW) of fused silica is the use of shorter laser wavelengths, which enable tighter focusing and enhanced absorption. In this study, the influence of process parameters on surface quality and material removal during DLW using a deep ultraviolet (DUV) ultrafast laser (257 nm, 1 ps) was investigated. A full-factorial design of the experiment was used to identify conditions that optimise both surface quality and ablation efficiency. Surface roughness as low as S-a approximate to 200 nm and material removal rates up to 0.048 mm(3).min(-1) were achieved. Conditions that led to surface degradation were also identified. Finally, the optimised parameters were applied to fabricate a microfluidic demonstrator. These results confirm that DUV ultrafast DLW is a powerful technique for fabricating high-fidelity features in fused silica with exceptional precision and quality that can be used for micro-optics or microfluidics devices.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20301 - Mechanical engineering
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Manufacturing Technology
ISSN
1213-2489
e-ISSN
2787-9402
Svazek periodika
25
Číslo periodika v rámci svazku
4
Stát vydavatele periodika
CZ - Česká republika
Počet stran výsledku
10
Strana od-do
521-530
Kód UT WoS článku
001605607700010
EID výsledku v databázi Scopus
—