Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00338185" target="_blank" >RIV/68378271:_____/09:00338185 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

Popis výsledku v původním jazyce

Fourier transform photocurrent spectroscopy (FTPS) is used as an inspection method for thin films of hydrogenated amorphous silicon deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process. Measurement technique utilizes transparent electrode in a sandwich arrangement. An elaborate calculation procedure is used to correct the measurement for the optical effects in order to obtain spectra of optical absorption coefficient. Correction procedure is based partly on analytical formulae and partly on Monte-Carlo simulations. We compared quality of thin layers deposited by PECVD on glass and aluminium foil with and without rough layer of SnO2. We observed positive effect ofaluminium and SnO2 on layer quality and effect of bandgap shift.

Název v anglickém jazyce

Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

Popis výsledku anglicky

Fourier transform photocurrent spectroscopy (FTPS) is used as an inspection method for thin films of hydrogenated amorphous silicon deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process. Measurement technique utilizes transparent electrode in a sandwich arrangement. An elaborate calculation procedure is used to correct the measurement for the optical effects in order to obtain spectra of optical absorption coefficient. Correction procedure is based partly on analytical formulae and partly on Monte-Carlo simulations. We compared quality of thin layers deposited by PECVD on glass and aluminium foil with and without rough layer of SnO2. We observed positive effect ofaluminium and SnO2 on layer quality and effect of bandgap shift.

Druh

O - Ostatní výsledky

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F09%2F0417" target="_blank" >GA202/09/0417: Nová nedestruktivní technika měření V-A křivek složených solárních článků</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů