Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00341170" target="_blank" >RIV/68378271:_____/09:00341170 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/67985882:_____/09:00341170
Výsledek na webu
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DOI - Digital Object Identifier
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Jazyk výsledku
angličtina
Název v původním jazyce
Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP
Popis výsledku v původním jazyce
Nanolayers were deposited onto surfaces of n-type InP single crystal wafers by electrophoresis from reverse micelle colloid solutions containing palladium nanoparticles. Two types of nanolayers were deposited, by applying a positive potential or a negative potential on the InP wafer. The nanolayers were studied by capacitance?voltage characteristics, atomic force microscopy, secondary-ion mass spectroscopy and current?voltage characteristics. Correlations among measured characterizations were found.
Název v anglickém jazyce
Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP
Popis výsledku anglicky
Nanolayers were deposited onto surfaces of n-type InP single crystal wafers by electrophoresis from reverse micelle colloid solutions containing palladium nanoparticles. Two types of nanolayers were deposited, by applying a positive potential or a negative potential on the InP wafer. The nanolayers were studied by capacitance?voltage characteristics, atomic force microscopy, secondary-ion mass spectroscopy and current?voltage characteristics. Correlations among measured characterizations were found.

Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
JA - Elektronika a optoelektronika, elektrotechnika
OECD FORD obor
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Rok uplatnění
2009
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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