Artifacts in atomic force microscopy of biological samples

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00390150" target="_blank" >RIV/68378271:_____/12:00390150 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.5772/2092" target="_blank" >http://dx.doi.org/10.5772/2092</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.5772/2092" target="_blank" >10.5772/2092</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Artifacts in atomic force microscopy of biological samples

Popis výsledku v původním jazyce

Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are adirect result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related tothe AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy.

Název v anglickém jazyce

Artifacts in atomic force microscopy of biological samples

Popis výsledku anglicky

Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are adirect result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related tothe AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy.

Druh

C - Kapitola v odborné knize

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Atomic Force Microscopy Investigations into Biology - From Cell to Protein

ISBN

978-953-51-0114-7

Počet stran výsledku

26

Strana od-do

29-54

Počet stran knihy

354

Název nakladatele

InTech

Místo vydání

Rijeka

Kód UT WoS kapitoly

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