X-ray analysis of fully depleted CCDs with small pixel size

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00485070" target="_blank" >RIV/68378271:_____/15:00485070 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016//j.nima.2014.10.027" target="_blank" >http://dx.doi.org/10.1016//j.nima.2014.10.027</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016//j.nima.2014.10.027" target="_blank" >10.1016//j.nima.2014.10.027</a>

Jazyk výsledku

angličtina

Název v původním jazyce

X-ray analysis of fully depleted CCDs with small pixel size

Popis výsledku v původním jazyce

X-ray frames offer a lot of information about CCD. sources are traditionally being used for CCD gain and charge transfer efficiency (CTE) measurements. We demonstrate how spectral lines of 55Fe and 241Am rad. sources are used for system linearity measurements. The pixel size of modern scientific CCDs is getting smaller. The charge diffusion causes the charge spread among neighboring pixels especially in thick fully depleted sensors. This enables measurement of the charge diffusion using 55Fe X-rays. On the other hand, the usual CTE characterization method based on single pixel X-ray events becomes statistically deficient. A new way of measuring CTE using shape and amplitude analysis of X-ray clusters is presented and discussed. The lateral diffusion measured using e2v CCD250 is presented and implications for X-ray cluster size and expected cluster shape are discussed. The CTE analysis using total X-ray cluster amplitude is presented.n

Název v anglickém jazyce

X-ray analysis of fully depleted CCDs with small pixel size

Popis výsledku anglicky

X-ray frames offer a lot of information about CCD. sources are traditionally being used for CCD gain and charge transfer efficiency (CTE) measurements. We demonstrate how spectral lines of 55Fe and 241Am rad. sources are used for system linearity measurements. The pixel size of modern scientific CCDs is getting smaller. The charge diffusion causes the charge spread among neighboring pixels especially in thick fully depleted sensors. This enables measurement of the charge diffusion using 55Fe X-rays. On the other hand, the usual CTE characterization method based on single pixel X-ray events becomes statistically deficient. A new way of measuring CTE using shape and amplitude analysis of X-ray clusters is presented and discussed. The lateral diffusion measured using e2v CCD250 is presented and implications for X-ray cluster size and expected cluster shape are discussed. The CTE analysis using total X-ray cluster amplitude is presented.n

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10308 - Astronomy (including astrophysics,space science)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section A

ISSN

0168-9002

e-ISSN

—

Svazek periodika

787

Číslo periodika v rámci svazku

Jul

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

8

Strana od-do

12-19

Kód UT WoS článku

000354869900004

EID výsledku v databázi Scopus

2-s2.0-84939934922