Comparison of MOVPE grown GaAs, InGaAs and GaAsSb covering layers for different InAs/GaAs quantum dot applications

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00474047" target="_blank" >RIV/68378271:_____/17:00474047 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.jcrysgro.2016.11.110" target="_blank" >http://dx.doi.org/10.1016/j.jcrysgro.2016.11.110</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.jcrysgro.2016.11.110" target="_blank" >10.1016/j.jcrysgro.2016.11.110</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Comparison of MOVPE grown GaAs, InGaAs and GaAsSb covering layers for different InAs/GaAs quantum dot applications

Popis výsledku v původním jazyce

InAs/GaAs QD HS with different covering layers (CLs) prepared by MOVPE are compared. The recombination energy of a structure covered only by GaAs depends nonlinearly on CL thickness. Experimental data of PL were supported by theoretical simulations. These simulations prove that the strain plays a major role. Due to the strain reduction, the recombination energy is decreased, so the structure has longer PL wavelength. By theoretical simulations it was shown that for high content of In in InGaAs covering layer (45% and more), the heterostructure is type II, which would normally be unreachable for flat layers. For the structure with GaAsSb SRL, the band alignment is highly dependent on the SRL composition. The type I/type II transition occurs for approximately 15% of Sb, this value also slightly depends on the QD size. All structures were also studied by HRTEM to show different behavior of the CLs on the interface with InAs which highly influences the structure quality.

Název v anglickém jazyce

Comparison of MOVPE grown GaAs, InGaAs and GaAsSb covering layers for different InAs/GaAs quantum dot applications

Popis výsledku anglicky

InAs/GaAs QD HS with different covering layers (CLs) prepared by MOVPE are compared. The recombination energy of a structure covered only by GaAs depends nonlinearly on CL thickness. Experimental data of PL were supported by theoretical simulations. These simulations prove that the strain plays a major role. Due to the strain reduction, the recombination energy is decreased, so the structure has longer PL wavelength. By theoretical simulations it was shown that for high content of In in InGaAs covering layer (45% and more), the heterostructure is type II, which would normally be unreachable for flat layers. For the structure with GaAsSb SRL, the band alignment is highly dependent on the SRL composition. The type I/type II transition occurs for approximately 15% of Sb, this value also slightly depends on the QD size. All structures were also studied by HRTEM to show different behavior of the CLs on the interface with InAs which highly influences the structure quality.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/LO1603" target="_blank" >LO1603: Centrum technologie a pokročilé strukturní analýzy aplikačně významných materiálů</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Crystal Growth

ISSN

0022-0248

e-ISSN

—

Svazek periodika

464

Číslo periodika v rámci svazku

Apr

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

59-63

Kód UT WoS článku

000398873500011

EID výsledku v databázi Scopus

2-s2.0-85015385142