Femtosecond laser studies of the single event effects in low gain avalanche detectors and PINs at ELI Beamlines

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00565722" target="_blank" >RIV/68378271:_____/22:00565722 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.nima.2022.167321" target="_blank" >https://doi.org/10.1016/j.nima.2022.167321</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nima.2022.167321" target="_blank" >10.1016/j.nima.2022.167321</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Femtosecond laser studies of the single event effects in low gain avalanche detectors and PINs at ELI Beamlines

Popis výsledku v původním jazyce

A feasibility study conducted at the laser facility ELI Beamlines confirms that fs-laser pulses can produce Single Event Effect (SEE), Single Event Upset (SEU) and Single Event Burnout (SEB) conditions in irradiated Low Gain Avalanche Detectors (LGADs) and the corresponding PIN diodes. A comprehensive and systematic study on PIN and LGAD mortality has been conducted to experimentally determine the stability, instability, and irreversible damage thresholds for LGADs and PINs exploiting a fs-laser system. Thresholds are given as sets of two parameters: bias voltage and laser pulse energy (energy deposition threshold). Using the Two-Photon Absorption (TPA) - Transient Current Technique (TCT) to study the mechanism that triggers SEU/SEB conditions in LGADs, as a function of illumination position establishes this technique as a promising tool for more advanced explorations of SEE, not only in LGADs but also in other Si-based sensors.n

Název v anglickém jazyce

Femtosecond laser studies of the single event effects in low gain avalanche detectors and PINs at ELI Beamlines

Popis výsledku anglicky

A feasibility study conducted at the laser facility ELI Beamlines confirms that fs-laser pulses can produce Single Event Effect (SEE), Single Event Upset (SEU) and Single Event Burnout (SEB) conditions in irradiated Low Gain Avalanche Detectors (LGADs) and the corresponding PIN diodes. A comprehensive and systematic study on PIN and LGAD mortality has been conducted to experimentally determine the stability, instability, and irreversible damage thresholds for LGADs and PINs exploiting a fs-laser system. Thresholds are given as sets of two parameters: bias voltage and laser pulse energy (energy deposition threshold). Using the Two-Photon Absorption (TPA) - Transient Current Technique (TCT) to study the mechanism that triggers SEU/SEB conditions in LGADs, as a function of illumination position establishes this technique as a promising tool for more advanced explorations of SEE, not only in LGADs but also in other Si-based sensors.n

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section A

ISSN

0168-9002

e-ISSN

1872-9576

Svazek periodika

1041

Číslo periodika v rámci svazku

OCT

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

167321

Kód UT WoS článku

000877453700008

EID výsledku v databázi Scopus

2-s2.0-85136673190