Electronic band structure vs intrinsic antisite doping in the MBE grown films MnTe · Bi(2-x)Te3(1-x/2) (0 ≥ x < 2): Evidence from spectroscopic ellipsometry and infrared studies
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F24%3A00603632" target="_blank" >RIV/68378271:_____/24:00603632 - isvavai.cz</a>
Výsledek na webu
<a href="https://doi.org/10.1063/5.0238665" target="_blank" >https://doi.org/10.1063/5.0238665</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/5.0238665" target="_blank" >10.1063/5.0238665</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Electronic band structure vs intrinsic antisite doping in the MBE grown films MnTe · Bi(2-x)Te3(1-x/2) (0 ≥ x < 2): Evidence from spectroscopic ellipsometry and infrared studies
Popis výsledku v původním jazyce
Intrinsic antisite defects influence the electronic and magnetic properties of antiferromagnetic topological insulators in the MnTe-Bi2Te3 family. These defects affect the position of the Fermi level and hinder the exploration of Dirac states. In this study, films with varying compositions of Bi and Te, ranging from MnTe to MnBi2Te4, were grown using molecular beam epitaxy on silicon substrates. The optical properties of these films were investigated using spectroscopic ellipsometry in the energy range of 0.5 to 6.5 electron volts, along with infrared reflectance and transmittance measurements. The analysis of optical spectra revealed that as the Bi and Te content increased, the dielectric function changed significantly. The imaginary part of the dielectric function showed a shift in its peak towards lower photon energies, which is characteristic of the final composition. Additionally, the stoichiometric MnBi2Te4 film exhibited an optical response associated with intrinsic antisite doping in the far-infrared range. However, in films with lower Bi and Te concentrations, the contribution from charge carriers was reduced. These changes in optical properties highlight the role of stoichiometry in controlling the electronic band structure and optical spectral weight distribution.
Název v anglickém jazyce
Electronic band structure vs intrinsic antisite doping in the MBE grown films MnTe · Bi(2-x)Te3(1-x/2) (0 ≥ x < 2): Evidence from spectroscopic ellipsometry and infrared studies
Popis výsledku anglicky
Intrinsic antisite defects influence the electronic and magnetic properties of antiferromagnetic topological insulators in the MnTe-Bi2Te3 family. These defects affect the position of the Fermi level and hinder the exploration of Dirac states. In this study, films with varying compositions of Bi and Te, ranging from MnTe to MnBi2Te4, were grown using molecular beam epitaxy on silicon substrates. The optical properties of these films were investigated using spectroscopic ellipsometry in the energy range of 0.5 to 6.5 electron volts, along with infrared reflectance and transmittance measurements. The analysis of optical spectra revealed that as the Bi and Te content increased, the dielectric function changed significantly. The imaginary part of the dielectric function showed a shift in its peak towards lower photon energies, which is characteristic of the final composition. Additionally, the stoichiometric MnBi2Te4 film exhibited an optical response associated with intrinsic antisite doping in the far-infrared range. However, in films with lower Bi and Te concentrations, the contribution from charge carriers was reduced. These changes in optical properties highlight the role of stoichiometry in controlling the electronic band structure and optical spectral weight distribution.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10306 - Optics (including laser optics and quantum optics)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2024
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Applied Physics Letters
ISSN
0003-6951
e-ISSN
1077-3118
Svazek periodika
125
Číslo periodika v rámci svazku
26
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
8
Strana od-do
262404
Kód UT WoS článku
001386148900016
EID výsledku v databázi Scopus
2-s2.0-85213061977