Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00635859" target="_blank" >RIV/68378271:_____/25:00635859 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/00216208:11320/25:10501548
Výsledek na webu
<a href="https://hdl.handle.net/11104/0369068" target="_blank" >https://hdl.handle.net/11104/0369068</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1361-6587/add08c" target="_blank" >10.1088/1361-6587/add08c</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor
Popis výsledku v původním jazyce
One of the problems of the liquid metal tokamak divertor technology is the redeposition of the released metal on the tokamak vessel walls. In this work an investigation of the removal of the redeposited metals from grounded conducting walls of tokamak was done by a low-temperature Ar plasma generated by electron cyclotron waves, radiofrequency electron cyclotron wave resonance (RF-ECWR), at 13.56 MHz in a new/modified system with a tunable plasma potential. The plasma potential was controlled in this system in the range from 0-270 V. The plasma potential control was achieved by adding an additional DC voltage supply on ECWR electrode via a suitable inductor having high impedance at the 13.56 MHz frequency. Metallic Sn thin films were deposited in the first step on the conducting doped Si wafer by means of medium frequency pulsed magnetron sputtering from pure Sn target. In the next step, the Sn films were removed from the Si substrate by ion etching (ion sputtering) by accelerated Ar ion fluxes. The etching efficiency was investigated in dependence on different values of the applied RF power and different values of the adjusted plasma potential. The ion density, electron temperature and the ion flux density impinging on the sample were determined by an RF probe system at different ECWR plasma conditions. The etching efficiency of Sn coatings was evaluated by profilometry measurement, SEM photography and electron microprobe analysis. It was found that this new/modified configuration of the ECWR plasma source can prospectively be used for cleaning of the grounded walls of tokamak from deposited Sn layers.
Název v anglickém jazyce
Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor
Popis výsledku anglicky
One of the problems of the liquid metal tokamak divertor technology is the redeposition of the released metal on the tokamak vessel walls. In this work an investigation of the removal of the redeposited metals from grounded conducting walls of tokamak was done by a low-temperature Ar plasma generated by electron cyclotron waves, radiofrequency electron cyclotron wave resonance (RF-ECWR), at 13.56 MHz in a new/modified system with a tunable plasma potential. The plasma potential was controlled in this system in the range from 0-270 V. The plasma potential control was achieved by adding an additional DC voltage supply on ECWR electrode via a suitable inductor having high impedance at the 13.56 MHz frequency. Metallic Sn thin films were deposited in the first step on the conducting doped Si wafer by means of medium frequency pulsed magnetron sputtering from pure Sn target. In the next step, the Sn films were removed from the Si substrate by ion etching (ion sputtering) by accelerated Ar ion fluxes. The etching efficiency was investigated in dependence on different values of the applied RF power and different values of the adjusted plasma potential. The ion density, electron temperature and the ion flux density impinging on the sample were determined by an RF probe system at different ECWR plasma conditions. The etching efficiency of Sn coatings was evaluated by profilometry measurement, SEM photography and electron microprobe analysis. It was found that this new/modified configuration of the ECWR plasma source can prospectively be used for cleaning of the grounded walls of tokamak from deposited Sn layers.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10305 - Fluids and plasma physics (including surface physics)
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Plasma Physics and Controlled Fusion
ISSN
0741-3335
e-ISSN
1361-6587
Svazek periodika
67
Číslo periodika v rámci svazku
5
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
8
Strana od-do
055035
Kód UT WoS článku
001482534800001
EID výsledku v databázi Scopus
2-s2.0-105005153957