Vše

Co hledáte?

Vše
Projekty
Výsledky výzkumu
Subjekty

Rychlé hledání

  • Projekty podpořené TA ČR
  • Významné projekty
  • Projekty s nejvyšší státní podporou
  • Aktuálně běžící projekty

Chytré vyhledávání

  • Takto najdu konkrétní +slovo
  • Takto z výsledků -slovo zcela vynechám
  • “Takto můžu najít celou frázi”

Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00635859" target="_blank" >RIV/68378271:_____/25:00635859 - isvavai.cz</a>

  • Nalezeny alternativní kódy

    RIV/00216208:11320/25:10501548

  • Výsledek na webu

    <a href="https://hdl.handle.net/11104/0369068" target="_blank" >https://hdl.handle.net/11104/0369068</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/1361-6587/add08c" target="_blank" >10.1088/1361-6587/add08c</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor

  • Popis výsledku v původním jazyce

    One of the problems of the liquid metal tokamak divertor technology is the redeposition of the released metal on the tokamak vessel walls. In this work an investigation of the removal of the redeposited metals from grounded conducting walls of tokamak was done by a low-temperature Ar plasma generated by electron cyclotron waves, radiofrequency electron cyclotron wave resonance (RF-ECWR), at 13.56 MHz in a new/modified system with a tunable plasma potential. The plasma potential was controlled in this system in the range from 0-270 V. The plasma potential control was achieved by adding an additional DC voltage supply on ECWR electrode via a suitable inductor having high impedance at the 13.56 MHz frequency. Metallic Sn thin films were deposited in the first step on the conducting doped Si wafer by means of medium frequency pulsed magnetron sputtering from pure Sn target. In the next step, the Sn films were removed from the Si substrate by ion etching (ion sputtering) by accelerated Ar ion fluxes. The etching efficiency was investigated in dependence on different values of the applied RF power and different values of the adjusted plasma potential. The ion density, electron temperature and the ion flux density impinging on the sample were determined by an RF probe system at different ECWR plasma conditions. The etching efficiency of Sn coatings was evaluated by profilometry measurement, SEM photography and electron microprobe analysis. It was found that this new/modified configuration of the ECWR plasma source can prospectively be used for cleaning of the grounded walls of tokamak from deposited Sn layers.

  • Název v anglickém jazyce

    Application of ECWR for tin removal with prospective use in tokamaks with liquid metal divertor

  • Popis výsledku anglicky

    One of the problems of the liquid metal tokamak divertor technology is the redeposition of the released metal on the tokamak vessel walls. In this work an investigation of the removal of the redeposited metals from grounded conducting walls of tokamak was done by a low-temperature Ar plasma generated by electron cyclotron waves, radiofrequency electron cyclotron wave resonance (RF-ECWR), at 13.56 MHz in a new/modified system with a tunable plasma potential. The plasma potential was controlled in this system in the range from 0-270 V. The plasma potential control was achieved by adding an additional DC voltage supply on ECWR electrode via a suitable inductor having high impedance at the 13.56 MHz frequency. Metallic Sn thin films were deposited in the first step on the conducting doped Si wafer by means of medium frequency pulsed magnetron sputtering from pure Sn target. In the next step, the Sn films were removed from the Si substrate by ion etching (ion sputtering) by accelerated Ar ion fluxes. The etching efficiency was investigated in dependence on different values of the applied RF power and different values of the adjusted plasma potential. The ion density, electron temperature and the ion flux density impinging on the sample were determined by an RF probe system at different ECWR plasma conditions. The etching efficiency of Sn coatings was evaluated by profilometry measurement, SEM photography and electron microprobe analysis. It was found that this new/modified configuration of the ECWR plasma source can prospectively be used for cleaning of the grounded walls of tokamak from deposited Sn layers.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10305 - Fluids and plasma physics (including surface physics)

Návaznosti výsledku

  • Projekt

    Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2025

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Plasma Physics and Controlled Fusion

  • ISSN

    0741-3335

  • e-ISSN

    1361-6587

  • Svazek periodika

    67

  • Číslo periodika v rámci svazku

    5

  • Stát vydavatele periodika

    US - Spojené státy americké

  • Počet stran výsledku

    8

  • Strana od-do

    055035

  • Kód UT WoS článku

    001482534800001

  • EID výsledku v databázi Scopus

    2-s2.0-105005153957