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Defect investigation in irradiated ATLAS18 ITk Strip Sensors using transient spectroscopy techniques

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00640827" target="_blank" >RIV/68378271:_____/25:00640827 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://hdl.handle.net/11104/0375146" target="_blank" >https://hdl.handle.net/11104/0375146</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.nima.2025.170713" target="_blank" >10.1016/j.nima.2025.170713</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Defect investigation in irradiated ATLAS18 ITk Strip Sensors using transient spectroscopy techniques

  • Popis výsledku v původním jazyce

    With the upgrade of the LHC to the High-Luminosity LHC (HL-LHC), the Inner Detector will be replaced with the new all-silicon ATLAS Inner Tracker (ITk). Comprising an active area of 165 m2, the outer detector layers will host strip modules, built with single-sided micro-strip sensors. The ATLAS18 main sensors were tested at different institutes in the collaboration for mechanical and electrical compliance with technical specifications, while technological parameters were verified on test structures from the same wafers before and after irradiation. Diodes fabricated as test structures were studied using variants of Deep-Level Transient Spectroscopy (DLTS). Irradiated diode samples were measured with Current-DLTS, using both electrical and photo-induced injection. Utilizing DLTS spectra with varying test parameters, trap energy levels and cross-sections associated with defects were obtained. This was done to improve the precision of sensor simulations as well as to compile a more complete model of radiation damage in ITk Strip Sensors. Moreover, previously observed features such as an increasing trend in the full depletion voltage after irradiation and little beneficial annealing in charge collection after high fluence irradiation of high energy protons were also investigated. Results obtained for samples with radiation damage from different sources at various fluences were compared.

  • Název v anglickém jazyce

    Defect investigation in irradiated ATLAS18 ITk Strip Sensors using transient spectroscopy techniques

  • Popis výsledku anglicky

    With the upgrade of the LHC to the High-Luminosity LHC (HL-LHC), the Inner Detector will be replaced with the new all-silicon ATLAS Inner Tracker (ITk). Comprising an active area of 165 m2, the outer detector layers will host strip modules, built with single-sided micro-strip sensors. The ATLAS18 main sensors were tested at different institutes in the collaboration for mechanical and electrical compliance with technical specifications, while technological parameters were verified on test structures from the same wafers before and after irradiation. Diodes fabricated as test structures were studied using variants of Deep-Level Transient Spectroscopy (DLTS). Irradiated diode samples were measured with Current-DLTS, using both electrical and photo-induced injection. Utilizing DLTS spectra with varying test parameters, trap energy levels and cross-sections associated with defects were obtained. This was done to improve the precision of sensor simulations as well as to compile a more complete model of radiation damage in ITk Strip Sensors. Moreover, previously observed features such as an increasing trend in the full depletion voltage after irradiation and little beneficial annealing in charge collection after high fluence irradiation of high energy protons were also investigated. Results obtained for samples with radiation damage from different sources at various fluences were compared.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10303 - Particles and field physics

Návaznosti výsledku

  • Projekt

    Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2025

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Nuclear Instruments & Methods in Physics Research Section A

  • ISSN

    0168-9002

  • e-ISSN

    1872-9576

  • Svazek periodika

    1080

  • Číslo periodika v rámci svazku

    Nov

  • Stát vydavatele periodika

    NL - Nizozemsko

  • Počet stran výsledku

    5

  • Strana od-do

    170713

  • Kód UT WoS článku

    001516238500003

  • EID výsledku v databázi Scopus

    2-s2.0-105008215293