TEST PATTERNS COMPRESSION TECHNIQUES BASED ON SAT SOLVING FOR SCAN-BASED DIGITAL CIRCUITS

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

TEST PATTERNS COMPRESSION TECHNIQUES BASED ON SAT SOLVING FOR SCAN-BASED DIGITAL CIRCUITS

Popis výsledku v původním jazyce

In the paper we propose a new method of test patterns compression based on SAT (SATisfiability) solving. By test patterns compression we can dramatically decrease test memory requirements for test patterns storing. This compression method is very suitable for scan-based digital circuits. Test patterns are decompressed in the scan chain during the test, no additional hardware is required. By this way we can also decrease the data bandwidth between ATE (Automatic Test Equipment) and the internal test mechanism. The main idea is based on test patterns overlapping introduced in the COMPAS (COMpressed Pattern Sequencer) compression tool [1]. Our proposed algorithm is based, as well as COMPAS, on patterns overlapping. During the test generation, we are trying to efficiently generate vectors as candidates for an overlap, unlike COMPAS, which is based on efficient overlapping of pre-generated test patterns. The results are compared with the COMPAS compression tool.

Název v anglickém jazyce

TEST PATTERNS COMPRESSION TECHNIQUES BASED ON SAT SOLVING FOR SCAN-BASED DIGITAL CIRCUITS

Popis výsledku anglicky

In the paper we propose a new method of test patterns compression based on SAT (SATisfiability) solving. By test patterns compression we can dramatically decrease test memory requirements for test patterns storing. This compression method is very suitable for scan-based digital circuits. Test patterns are decompressed in the scan chain during the test, no additional hardware is required. By this way we can also decrease the data bandwidth between ATE (Automatic Test Equipment) and the internal test mechanism. The main idea is based on test patterns overlapping introduced in the COMPAS (COMpressed Pattern Sequencer) compression tool [1]. Our proposed algorithm is based, as well as COMPAS, on patterns overlapping. During the test generation, we are trying to efficiently generate vectors as candidates for an overlap, unlike COMPAS, which is based on efficient overlapping of pre-generated test patterns. The results are compared with the COMPAS compression tool.

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Počítačové architektury a diagnostika 2009

ISBN

978-80-7318-847-4

ISSN

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e-ISSN

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Počet stran výsledku

6

Strana od-do

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Název nakladatele

Universita Tomáše Bati ve Zlíně

Místo vydání

Zlín

Místo konání akce

Soláň

Datum konání akce

9. 9. 2009

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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