Hot Pixels Suppression in Structured Illumination Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00312004" target="_blank" >RIV/68407700:21230/17:00312004 - isvavai.cz</a>

Výsledek na webu

<a href="http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf" target="_blank" >http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf</a>

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Hot Pixels Suppression in Structured Illumination Microscopy

Popis výsledku v původním jazyce

Structured Illumination Microscopy (SIM) is a super-resolution fluorescence technique which enables to enhance the resolution of optical microscopes beyond the diffraction limit. The final super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require the input images with high signal to noise ratio (SNR). However, the light emitted from the sample labeled with a fluorescence dye is weak. Therefore, the long exposure time (in the order of seconds) is required. The low number of photons, due to the weakness of fluorescence dye, captured by camera sensor causes the high bias of the acquired image by additional noise sources (read-out noise, Poisson noise). Further, the long exposure time leads to the thermal noise. In this paper, we focus on the thermal noise, especially on the hot pixels, whose values are four or more standard deviations above the mean. These hot pixels dramatically decrease the dynamic range of final discrete value image. Therefore, the SIM image reconstruction may fail because of the normalization and rounding during the reconstruction.

Název v anglickém jazyce

Hot Pixels Suppression in Structured Illumination Microscopy

Popis výsledku anglicky

Structured Illumination Microscopy (SIM) is a super-resolution fluorescence technique which enables to enhance the resolution of optical microscopes beyond the diffraction limit. The final super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require the input images with high signal to noise ratio (SNR). However, the light emitted from the sample labeled with a fluorescence dye is weak. Therefore, the long exposure time (in the order of seconds) is required. The low number of photons, due to the weakness of fluorescence dye, captured by camera sensor causes the high bias of the acquired image by additional noise sources (read-out noise, Poisson noise). Further, the long exposure time leads to the thermal noise. In this paper, we focus on the thermal noise, especially on the hot pixels, whose values are four or more standard deviations above the mean. These hot pixels dramatically decrease the dynamic range of final discrete value image. Therefore, the SIM image reconstruction may fail because of the normalization and rounding during the reconstruction.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the International Student Scientific Conference Poster – 21/2017

ISBN

978-80-01-06153-4

ISSN

—

e-ISSN

—

Počet stran výsledku

70

Strana od-do

—

Název nakladatele

Czech Technical University in Prague

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

23. 5. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—