Analysis of image reconstruction artifacts in structured illumination microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00313935" target="_blank" >RIV/68407700:21230/17:00313935 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1117/12.2274418" target="_blank" >http://dx.doi.org/10.1117/12.2274418</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2274418" target="_blank" >10.1117/12.2274418</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Analysis of image reconstruction artifacts in structured illumination microscopy

Popis výsledku v původním jazyce

Structured Illumination Microscopy (SIM) is a super-resolution technique which enables to enhance the resolution of optical microscopes beyond the diraction limit. The nal super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require precise knowledge of the illumination pattern and assume the sample to be stationary during the acquisition of illumination patterned images. In the case of imaging live cells, the movements of the cell result in the occurrence of image reconstruction artifacts. To reduce this kind of artifacts the short acquisition time is needed. However, short exposure time causes low signal-to-noise ratio (SNR). Moreover, a drift of the specimen may distort the illumination pattern properties in each image. This issue together with the low SNR makes the estimation of reconstruction parameters a challenging task. Inaccurate assessment of spatial frequency, phase shift or orientation of the illumination pattern leads to incorrect separation and shift of spectral components in Fourier space. This results in unwanted image reconstruction artifacts and hampers the resolution enhancement in practice. In this paper, we analyze possible artifacts in super-resolution images reconstructed using super-resolution SIM technique (SR-SIM). An overview of typical image reconstruction artifact types is presented. Distinguishing image artifacts from newly resolved sample features is essential for future SIM applications in cell biology.

Název v anglickém jazyce

Analysis of image reconstruction artifacts in structured illumination microscopy

Popis výsledku anglicky

Structured Illumination Microscopy (SIM) is a super-resolution technique which enables to enhance the resolution of optical microscopes beyond the diraction limit. The nal super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require precise knowledge of the illumination pattern and assume the sample to be stationary during the acquisition of illumination patterned images. In the case of imaging live cells, the movements of the cell result in the occurrence of image reconstruction artifacts. To reduce this kind of artifacts the short acquisition time is needed. However, short exposure time causes low signal-to-noise ratio (SNR). Moreover, a drift of the specimen may distort the illumination pattern properties in each image. This issue together with the low SNR makes the estimation of reconstruction parameters a challenging task. Inaccurate assessment of spatial frequency, phase shift or orientation of the illumination pattern leads to incorrect separation and shift of spectral components in Fourier space. This results in unwanted image reconstruction artifacts and hampers the resolution enhancement in practice. In this paper, we analyze possible artifacts in super-resolution images reconstructed using super-resolution SIM technique (SR-SIM). An overview of typical image reconstruction artifact types is presented. Distinguishing image artifacts from newly resolved sample features is essential for future SIM applications in cell biology.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/GA17-05840S" target="_blank" >GA17-05840S: Multikriteriální optimalizace modelů prostorově variantních zobrazovacích systémů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Applications of Digital Image Processing XL

ISBN

978-1-5106-1249-5

ISSN

0277-786X

e-ISSN

—

Počet stran výsledku

12

Strana od-do

"1039632-1"-"1039632-13"

Název nakladatele

SPIE

Místo vydání

Bellingham

Místo konání akce

San Diego, California

Datum konání akce

6. 8. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000418443700087