Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00364314" target="_blank" >RIV/68407700:21230/23:00364314 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1109/TIM.2023.3246502" target="_blank" >https://doi.org/10.1109/TIM.2023.3246502</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TIM.2023.3246502" target="_blank" >10.1109/TIM.2023.3246502</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients

Popis výsledku v původním jazyce

This article concerns an uncertainty analysis of interferometric transmission measurements and standard reflec- tion measurements of extreme impedances (extreme reflection coefficients) and broadens the scope of previously published works. Specifically, this article focuses on revealing fundamental limits influencing achievable measurement accuracy and preci- sion by means of the law of uncertainty propagation (LUP). The analysis considers the sources of uncertainty influencing every measurement, in particular phase noise and thermal noise. The proportion of uncertainties of standard reflection measurements and interferometric measurements is derived theoretically and experimentally verified for two cases with dominant either the phase noise or the thermal noise. The values determined experimentally in a frequency band from 2 to 4.5 GHz agree well with the values derived theoretically.

Název v anglickém jazyce

Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients

Popis výsledku anglicky

This article concerns an uncertainty analysis of interferometric transmission measurements and standard reflec- tion measurements of extreme impedances (extreme reflection coefficients) and broadens the scope of previously published works. Specifically, this article focuses on revealing fundamental limits influencing achievable measurement accuracy and preci- sion by means of the law of uncertainty propagation (LUP). The analysis considers the sources of uncertainty influencing every measurement, in particular phase noise and thermal noise. The proportion of uncertainties of standard reflection measurements and interferometric measurements is derived theoretically and experimentally verified for two cases with dominant either the phase noise or the thermal noise. The values determined experimentally in a frequency band from 2 to 4.5 GHz agree well with the values derived theoretically.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Instrumentation and Measurement

ISSN

0018-9456

e-ISSN

1557-9662

Svazek periodika

72

Číslo periodika v rámci svazku

February

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

1-10

Kód UT WoS článku

000944502900013

EID výsledku v databázi Scopus

2-s2.0-85149402876