Effect of TiO2 Nanoparticles Addition on the Electrochemical Migration of Lead-Free Sn-Bi Alloys

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00377082" target="_blank" >RIV/68407700:21230/24:00377082 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1109/ISSE61612.2024.10604022" target="_blank" >https://doi.org/10.1109/ISSE61612.2024.10604022</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/ISSE61612.2024.10604022" target="_blank" >10.1109/ISSE61612.2024.10604022</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Effect of TiO2 Nanoparticles Addition on the Electrochemical Migration of Lead-Free Sn-Bi Alloys

Popis výsledku v původním jazyce

This research aimed to investigate the susceptibility of Sn-58Bi alloys to Electrochemical Migration (ECM) when combined with TiO2 nanoparticles tested in various solutions, including deionized water (DI), 1 mM Na2SO4, 500 mM Na2SO4, 1 mM NaCl, and 500 mM NaCl, using water drop (WD) test. The results revealed a heightened ECM susceptibility in Sn-58Bi alloys with the addition of TiO2 nanoparticles, indicating an adverse impact of TiO2 nanoparticle incorporation. Furthermore, scanning electron microscopy and energy dispersive X-ray spectroscopy (SEMEDS) were utilized to analyze the surface morphology and elemental composition of dendrites formed after the WD tests. The outcomes showed the presence of dendrites and precipitates in both Sn-58Bi and Sn-58Bi-0.1% TiO2 cases. Sn was identified as the primary element in the dendrites, while Bi was not detected in the dendrites in any of the cases. Consequently, the reliability of electronics may be compromised when using Bi-Sn paste doped with TiO2 nanoparticles, particularly in terms of ECM. Nonetheless, these nanoparticles could enhance other properties associated with modified microstructure, such as mechanical or thermal properties, which warrant further investigation.

Název v anglickém jazyce

Effect of TiO2 Nanoparticles Addition on the Electrochemical Migration of Lead-Free Sn-Bi Alloys

Popis výsledku anglicky

This research aimed to investigate the susceptibility of Sn-58Bi alloys to Electrochemical Migration (ECM) when combined with TiO2 nanoparticles tested in various solutions, including deionized water (DI), 1 mM Na2SO4, 500 mM Na2SO4, 1 mM NaCl, and 500 mM NaCl, using water drop (WD) test. The results revealed a heightened ECM susceptibility in Sn-58Bi alloys with the addition of TiO2 nanoparticles, indicating an adverse impact of TiO2 nanoparticle incorporation. Furthermore, scanning electron microscopy and energy dispersive X-ray spectroscopy (SEMEDS) were utilized to analyze the surface morphology and elemental composition of dendrites formed after the WD tests. The outcomes showed the presence of dendrites and precipitates in both Sn-58Bi and Sn-58Bi-0.1% TiO2 cases. Sn was identified as the primary element in the dendrites, while Bi was not detected in the dendrites in any of the cases. Consequently, the reliability of electronics may be compromised when using Bi-Sn paste doped with TiO2 nanoparticles, particularly in terms of ECM. Nonetheless, these nanoparticles could enhance other properties associated with modified microstructure, such as mechanical or thermal properties, which warrant further investigation.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

2024 47th International Spring Seminar on Electronics Technology (ISSE)

ISBN

979-8-3503-8548-9

ISSN

2161-2536

e-ISSN

—

Počet stran výsledku

6

Strana od-do

—

Název nakladatele

IEEE Press

Místo vydání

New York

Místo konání akce

Praha

Datum konání akce

15. 5. 2024

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

001283808200060