Test pattern compression based on pattern overlapping and broadcasting

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00182780" target="_blank" >RIV/68407700:21240/11:00182780 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Test pattern compression based on pattern overlapping and broadcasting

Popis výsledku v původním jazyce

Integrated circuits (IC) are traditionally tested using tester device called an Automatic Test Equipment (ATE). Test data are stored in the ATE and are transferred to the circuit during test. Responses are than transferred back to the ATE and compared with stored correct responses whether the circuit under test (CUT) is fault free or not. With each IC technology generation, the developments in this field has lead to computer chips containing more complex logic, thus the test data amount and test time increase rapidly. This problem is usually solved by using various test compression techniques. Test compression involves storing compressed test data in the ATE, test data transfer in compressed form and on-chip test data decompression. Compressed Test Pattern Sequencer (COMPAS) is a test compression technique based on pattern overlapping that has high compression ratio. It uses...

Název v anglickém jazyce

Test pattern compression based on pattern overlapping and broadcasting

Popis výsledku anglicky

Integrated circuits (IC) are traditionally tested using tester device called an Automatic Test Equipment (ATE). Test data are stored in the ATE and are transferred to the circuit during test. Responses are than transferred back to the ATE and compared with stored correct responses whether the circuit under test (CUT) is fault free or not. With each IC technology generation, the developments in this field has lead to computer chips containing more complex logic, thus the test data amount and test time increase rapidly. This problem is usually solved by using various test compression techniques. Test compression involves storing compressed test data in the ATE, test data transfer in compressed form and on-chip test data decompression. Compressed Test Pattern Sequencer (COMPAS) is a test compression technique based on pattern overlapping that has high compression ratio. It uses...

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: Zvyšování spolehlivosti a provozuschopnosti v obvodech SoC</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceeding of the 7th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science

ISBN

978-80-214-4305-1

ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

111

Název nakladatele

Brno University of Technology

Místo vydání

Brno

Místo konání akce

Lednice

Datum konání akce

14. 10. 2011

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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