Thermoelectric Simple and Multilayers Prepared by Laser

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F16%3A00237808" target="_blank" >RIV/68407700:21460/16:00237808 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.scirp.org/journal/PaperInformation.aspx?PaperID=62603" target="_blank" >http://www.scirp.org/journal/PaperInformation.aspx?PaperID=62603</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.4236/msce.2016.41010" target="_blank" >10.4236/msce.2016.41010</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Thermoelectric Simple and Multilayers Prepared by Laser

Popis výsledku v původním jazyce

Thermoelectric layers as Bi2Te3, Yb0.19Co4Sb12, FeSb2Te, Ce0.1Fe0.7Co3.3Sb12 and FeSb2Te/Ce0.1Fe0.7Co3.3Sb12 multilayers were prepared by Pulsed Laser Deposition (PLD). Smooth, nano-crystalline, stoichiometric layers were synthetized in a classical PLD arrangement or in a special off-axis PLD arrangement, followed by Rapid thermal annealing. Results of physical characterizations such as morphology—Atomic Force Microscope, Scanning Electron Microscope, composition-Energy Dispersive X-ray analysis, crystallinity—X-ray Diffraction, separation of multilayers—Secondary of ion beam mass spectroscopy SIMS and study of thermoelectric properties such as the thermoelectric figure of merit ZT, in-plane electrical resistivity, Seebeck coefficient and thermal conductivity are presented. For thermal conductivity measurement a newly developed Atomic force thermal microscope (AFMTh) was tested. Results obtained on the single layers compared to multi-layered structures are discussed.

Název v anglickém jazyce

Thermoelectric Simple and Multilayers Prepared by Laser

Popis výsledku anglicky

Thermoelectric layers as Bi2Te3, Yb0.19Co4Sb12, FeSb2Te, Ce0.1Fe0.7Co3.3Sb12 and FeSb2Te/Ce0.1Fe0.7Co3.3Sb12 multilayers were prepared by Pulsed Laser Deposition (PLD). Smooth, nano-crystalline, stoichiometric layers were synthetized in a classical PLD arrangement or in a special off-axis PLD arrangement, followed by Rapid thermal annealing. Results of physical characterizations such as morphology—Atomic Force Microscope, Scanning Electron Microscope, composition-Energy Dispersive X-ray analysis, crystallinity—X-ray Diffraction, separation of multilayers—Secondary of ion beam mass spectroscopy SIMS and study of thermoelectric properties such as the thermoelectric figure of merit ZT, in-plane electrical resistivity, Seebeck coefficient and thermal conductivity are presented. For thermal conductivity measurement a newly developed Atomic force thermal microscope (AFMTh) was tested. Results obtained on the single layers compared to multi-layered structures are discussed.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Materials Science and Chemical Engineering

ISSN

2327-6053

e-ISSN

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Svazek periodika

4

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

13

Strana od-do

52-64

Kód UT WoS článku

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EID výsledku v databázi Scopus

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