Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F18%3A00329980" target="_blank" >RIV/68407700:21670/18:00329980 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1088/1748-0221/13/04/P04002" target="_blank" >http://dx.doi.org/10.1088/1748-0221/13/04/P04002</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/13/04/P04002" target="_blank" >10.1088/1748-0221/13/04/P04002</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
Popis výsledku v původním jazyce
Direct conversion semiconductor detectors have become an indispensable tool in radiation detection by now. In order to obtain a high detection efficiency, especially when detecting X or gamma rays, high-Z semiconductor sensors are necessary. Like other compound semiconductors GaAs, compensated by chromium (GaAs:Cr), suffers from a number of defects that affect the charge collection efficiency and homogeneity of the material. A precise knowledge of this problem is important to predict the performance of such detectors and eventually correct their response in specific applications. In this study we analyse the homogeneity and mobility-lifetime products (mu(e)tau(e)) of a 500 mu m thick GaAs:Cr pixelated sensor connected to a Timepix chip. The detector is irradiated by 23 keV X-rays, each pixel recording the number of photon interactions and the charge they induce on its electrode. The mu(e)tau(e) products are extracted on a per-pixel basis, using the Hecht equation corrected for the small pixel effect. The detector shows a good time stability in the experimental conditions. Significant inhomogeneities are observed in photon counting and charge collection efficiencies. An average mu(e)tau(e) of 1.0.10(-4) cm(2) V-1 is found, and compared with values obtained by other methods for the same material. Solutions to improve the response are discussed.
Název v anglickém jazyce
Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
Popis výsledku anglicky
Direct conversion semiconductor detectors have become an indispensable tool in radiation detection by now. In order to obtain a high detection efficiency, especially when detecting X or gamma rays, high-Z semiconductor sensors are necessary. Like other compound semiconductors GaAs, compensated by chromium (GaAs:Cr), suffers from a number of defects that affect the charge collection efficiency and homogeneity of the material. A precise knowledge of this problem is important to predict the performance of such detectors and eventually correct their response in specific applications. In this study we analyse the homogeneity and mobility-lifetime products (mu(e)tau(e)) of a 500 mu m thick GaAs:Cr pixelated sensor connected to a Timepix chip. The detector is irradiated by 23 keV X-rays, each pixel recording the number of photon interactions and the charge they induce on its electrode. The mu(e)tau(e) products are extracted on a per-pixel basis, using the Hecht equation corrected for the small pixel effect. The detector shows a good time stability in the experimental conditions. Significant inhomogeneities are observed in photon counting and charge collection efficiencies. An average mu(e)tau(e) of 1.0.10(-4) cm(2) V-1 is found, and compared with values obtained by other methods for the same material. Solutions to improve the response are discussed.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10303 - Particles and field physics
Návaznosti výsledku
Projekt
<a href="/cs/project/EF16_019%2F0000766" target="_blank" >EF16_019/0000766: Inženýrské aplikace fyziky mikrosvěta</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2018
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
1748-0221
Svazek periodika
13
Číslo periodika v rámci svazku
P04002
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
13
Strana od-do
—
Kód UT WoS článku
000429055400002
EID výsledku v databázi Scopus
2-s2.0-85046637366