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Analysis of capacitive touchscreen electrodes design patterns from an EMI/EMS perspective

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F25%3A63600278" target="_blank" >RIV/70883521:28140/25:63600278 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://ieeexplore.ieee.org/document/11170267" target="_blank" >https://ieeexplore.ieee.org/document/11170267</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/EMCSIPI52291.2025.11170267" target="_blank" >10.1109/EMCSIPI52291.2025.11170267</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Analysis of capacitive touchscreen electrodes design patterns from an EMI/EMS perspective

  • Popis výsledku v původním jazyce

    Capacitive touch sensing has gained traction in modern human-machine interfaces (HMIs) due to its cost efficiency, versatility, and reliability. In parallel, the proliferation of high-speed wireless systems has spurred interest in integrating high-frequency antennas within touch screen panels (TSPs). As device dimensions continue to expand, particularly in large-screen applications, addressing challenges arising from the touch-sensing circuitry and TSP design is crucial, particularly in electromagnetic interference (EMI) and electromagnetic susceptibility (EMS). This research primarily focuses on the simulation and experimental study of various commonly used capacitive touchscreen patterns and the analysis of how these configurations influence signal coupling between touch electrodes and the surrounding environment. The results show that larger screens with complex touch electrode patterns exhibit an increased propensity to couple with undesired signals across different frequencies. While TSPs with simpler electrode design patterns can partially mitigate these effects, they might introduce additional challenges, such as higher parasitic capacitances and increased loading on the drive circuitry. However, designing TSPs with intrinsically higher immunity to EMS and lower emissions while keeping the signal-to-noise ratio (SNR) within tolerance remains vital for touch-based HMI deployment for critical systems in noise-prone environments, such as electric automotive systems.

  • Název v anglickém jazyce

    Analysis of capacitive touchscreen electrodes design patterns from an EMI/EMS perspective

  • Popis výsledku anglicky

    Capacitive touch sensing has gained traction in modern human-machine interfaces (HMIs) due to its cost efficiency, versatility, and reliability. In parallel, the proliferation of high-speed wireless systems has spurred interest in integrating high-frequency antennas within touch screen panels (TSPs). As device dimensions continue to expand, particularly in large-screen applications, addressing challenges arising from the touch-sensing circuitry and TSP design is crucial, particularly in electromagnetic interference (EMI) and electromagnetic susceptibility (EMS). This research primarily focuses on the simulation and experimental study of various commonly used capacitive touchscreen patterns and the analysis of how these configurations influence signal coupling between touch electrodes and the surrounding environment. The results show that larger screens with complex touch electrode patterns exhibit an increased propensity to couple with undesired signals across different frequencies. While TSPs with simpler electrode design patterns can partially mitigate these effects, they might introduce additional challenges, such as higher parasitic capacitances and increased loading on the drive circuitry. However, designing TSPs with intrinsically higher immunity to EMS and lower emissions while keeping the signal-to-noise ratio (SNR) within tolerance remains vital for touch-based HMI deployment for critical systems in noise-prone environments, such as electric automotive systems.

Klasifikace

  • Druh

    D - Stať ve sborníku

  • CEP obor

  • OECD FORD obor

    20201 - Electrical and electronic engineering

Návaznosti výsledku

  • Projekt

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2025

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název statě ve sborníku

    IEEE International Symposium on Electromagnetic Compatibility

  • ISBN

    979-8-3315-0875-3

  • ISSN

    2158-110X

  • e-ISSN

    2158-1118

  • Počet stran výsledku

    6

  • Strana od-do

    523-528

  • Název nakladatele

    IEEE

  • Místo vydání

    New York

  • Místo konání akce

    Raleigh

  • Datum konání akce

    18. 8. 2025

  • Typ akce podle státní příslušnosti

    WRD - Celosvětová akce

  • Kód UT WoS článku

    001692753900122