Publishable Summary On-wafer microwave metrology for future industrial applications (23IND10)

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F24%3AN0000045" target="_blank" >RIV/00177016:_____/24:N0000045 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.euramet.org/research-innovation/search-research-projects/details/project/on-wafer-microwave-metrology-for-future-industrial-applications" target="_blank" >https://www.euramet.org/research-innovation/search-research-projects/details/project/on-wafer-microwave-metrology-for-future-industrial-applications</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Publishable Summary On-wafer microwave metrology for future industrial applications (23IND10)

Popis výsledku v původním jazyce

This project will strengthen the European semiconductor industry and facilitate the development of next-generation semiconductor technologies for established and emerging applications, e.g., 6G telecommunications, automotive radar sensors, and wearable electronics for healthcare. The project will develop new, accurate and traceable on-wafer measurement techniques for semiconductors. This includes using new quantum sensing concepts, artificial intelligence and new on-wafer techniques for characterising compound transistors operating up to 220 GHz, and novel 2D, thin-film and semiconductor materials. The project aim is to push beyond the uncertainties and traceability of current on-wafer microwave capabilities for millimetre-wave integrated circuits, particularly those based on compound semiconductors.

Název v anglickém jazyce

Publishable Summary On-wafer microwave metrology for future industrial applications (23IND10)

Popis výsledku anglicky

This project will strengthen the European semiconductor industry and facilitate the development of next-generation semiconductor technologies for established and emerging applications, e.g., 6G telecommunications, automotive radar sensors, and wearable electronics for healthcare. The project will develop new, accurate and traceable on-wafer measurement techniques for semiconductors. This includes using new quantum sensing concepts, artificial intelligence and new on-wafer techniques for characterising compound transistors operating up to 220 GHz, and novel 2D, thin-film and semiconductor materials. The project aim is to push beyond the uncertainties and traceability of current on-wafer microwave capabilities for millimetre-wave integrated circuits, particularly those based on compound semiconductors.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/9B24017" target="_blank" >9B24017: On-wafer microwave metrology for future industrial applications</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů