High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10384698" target="_blank" >RIV/00216208:11320/18:10384698 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081723:_____/18:00493520

Výsledek na webu

<a href="https://doi.org/10.1016/j.tsf.2017.10.060" target="_blank" >https://doi.org/10.1016/j.tsf.2017.10.060</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2017.10.060" target="_blank" >10.1016/j.tsf.2017.10.060</a>

Jazyk výsledku

angličtina

Název v původním jazyce

High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure

Popis výsledku v původním jazyce

An analytical model to calculate the noise spectral density in Metal-Semiconductor-Metal (M-S-M) structure of Schottky contacts has been developed. The model based on the linearization of Langevin approach of carrier motion inside a bulk semiconductor, and taking into account the fluctuations in the leakage current through the structure due to the barrier lowering by the image force effect. Particularly, the calculations describe two quantities of noise: electric field and total current spectral densities. The results obtained from the Au-CdTe-Au Schottky structure exhibit sharp resonances due to the effect of plasma frequency oscillations and the relative thickness of the depletion region below the anode. Moreover, the noise current spectrum exhibits Lorentzian behavior when the M-S-M has the form of a homogenous structure (thickness of depletion region approximate to 0). These results are in agreement with that reported by Monte Carlo technique of metal Schottky structure. The discussion of the noise spectra as a function of structure parameters revealed that the nanometric M-S-M structures with undoped CdTe can be used as Schottky detectors/emitters in Terahertz frequency applications.

Název v anglickém jazyce

High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure

Popis výsledku anglicky

An analytical model to calculate the noise spectral density in Metal-Semiconductor-Metal (M-S-M) structure of Schottky contacts has been developed. The model based on the linearization of Langevin approach of carrier motion inside a bulk semiconductor, and taking into account the fluctuations in the leakage current through the structure due to the barrier lowering by the image force effect. Particularly, the calculations describe two quantities of noise: electric field and total current spectral densities. The results obtained from the Au-CdTe-Au Schottky structure exhibit sharp resonances due to the effect of plasma frequency oscillations and the relative thickness of the depletion region below the anode. Moreover, the noise current spectrum exhibits Lorentzian behavior when the M-S-M has the form of a homogenous structure (thickness of depletion region approximate to 0). These results are in agreement with that reported by Monte Carlo technique of metal Schottky structure. The discussion of the noise spectra as a function of structure parameters revealed that the nanometric M-S-M structures with undoped CdTe can be used as Schottky detectors/emitters in Terahertz frequency applications.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Thin Solid Films

ISSN

0040-6090

e-ISSN

—

Svazek periodika

645

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

340-344

Kód UT WoS článku

000418305200050

EID výsledku v databázi Scopus

2-s2.0-85033432138