Use of flicker noise in polyaniline to determine the product of mobility and lifetime of charge carriers

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F21%3A10436038" target="_blank" >RIV/00216208:11320/21:10436038 - isvavai.cz</a>

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=Za~I8HBnpg" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=Za~I8HBnpg</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/5.0040556" target="_blank" >10.1063/5.0040556</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Use of flicker noise in polyaniline to determine the product of mobility and lifetime of charge carriers

Popis výsledku v původním jazyce

The current passing through a polyaniline layer generates electrical fluctuations, the amplitude of which increases in a part of the frequency spectrum with the inversion of the frequency f. It is deduced that this is due to the behavior of charge carriers trapped on energy levels in the bandgap. If these localized carriers are in equilibrium with the valence band, a frequency range can be found where the lifetime is inversely proportional to the frequency. Electron jumps between the levels and the valence band are manifested by the generation of electrical noise signals. The slope of the dependence of the noise current on 1/f was calculated, and the product of the mobility and lifetime of the holes was determined.

Název v anglickém jazyce

Use of flicker noise in polyaniline to determine the product of mobility and lifetime of charge carriers

Popis výsledku anglicky

The current passing through a polyaniline layer generates electrical fluctuations, the amplitude of which increases in a part of the frequency spectrum with the inversion of the frequency f. It is deduced that this is due to the behavior of charge carriers trapped on energy levels in the bandgap. If these localized carriers are in equilibrium with the valence band, a frequency range can be found where the lifetime is inversely proportional to the frequency. Electron jumps between the levels and the valence band are manifested by the generation of electrical noise signals. The slope of the dependence of the noise current on 1/f was calculated, and the product of the mobility and lifetime of the holes was determined.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Physics Letters

ISSN

0003-6951

e-ISSN

—

Svazek periodika

118

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

3

Strana od-do

102103

Kód UT WoS článku

000627444900003

EID výsledku v databázi Scopus

2-s2.0-85102437910